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Page 130
4-11 Temperature factor . So far we have considered a crystal as a collection of
atoms located at fixed points in the lattice . Actually , the atoms undergo thermal
vibration about their mean positions even at the absolute zero of temperature ,
and ...
4-11 Temperature factor . So far we have considered a crystal as a collection of
atoms located at fixed points in the lattice . Actually , the atoms undergo thermal
vibration about their mean positions even at the absolute zero of temperature ,
and ...
Page 131
angles ; however , if the comparison of line intensities is restricted to lines not
differing too greatly in 8 values , the absorption and temperature effects can be
safely ignored . This is a fortunate circumstance , since both of these effects are
rather ...
angles ; however , if the comparison of line intensities is restricted to lines not
differing too greatly in 8 values , the absorption and temperature effects can be
safely ignored . This is a fortunate circumstance , since both of these effects are
rather ...
Page 156
6-5 Cameras for high and low temperatures . Metallurgical investigations
frequently require that the crystal structure of a phase stable only at high
temperature be determined . In many cases , this can be accomplished by
quenching the ...
6-5 Cameras for high and low temperatures . Metallurgical investigations
frequently require that the crystal structure of a phase stable only at high
temperature be determined . In many cases , this can be accomplished by
quenching the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |