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Page 188
We can prove plate : incident and diffracted beams have a thickness of 1 cm in a
direction this by calculating the effect of absorpnormal to the plane of the drawing
. tion in the specimen on the intensity of the diffracted beam , and , since this ...
We can prove plate : incident and diffracted beams have a thickness of 1 cm in a
direction this by calculating the effect of absorpnormal to the plane of the drawing
. tion in the specimen on the intensity of the diffracted beam , and , since this ...
Page 192
tion do not acquire enough energy to ionize other atoms . But when the voltage is
raised into the proportional counter region , A becomes of the order of 10 % to
105 . The current pulse in the anode wire is normally expressed in terms of the ...
tion do not acquire enough energy to ionize other atoms . But when the voltage is
raised into the proportional counter region , A becomes of the order of 10 % to
105 . The current pulse in the anode wire is normally expressed in terms of the ...
Page 513
... 266 Setting a crystal in a required orientaPowder method , 93 , 149 , 500 tion ,
240 Preferred orientation ( see Texture ) Short - range order , 375 , 376 Primitive
cells , 33 , 36 Short - wavelength limit , 5 Principal stresses , 436 SIEGBAHN , M.
... 266 Setting a crystal in a required orientaPowder method , 93 , 149 , 500 tion ,
240 Preferred orientation ( see Texture ) Short - range order , 375 , 376 Primitive
cells , 33 , 36 Short - wavelength limit , 5 Principal stresses , 436 SIEGBAHN , M.
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |