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Page 12
termed hard , while long - wavelength x - rays are easily absorbed and are said
to be soft . Matter absorbs x - rays in two distinct ways , by scattering and by true
absorption , and these two processes together make up the total absorption ...
termed hard , while long - wavelength x - rays are easily absorbed and are said
to be soft . Matter absorbs x - rays in two distinct ways , by scattering and by true
absorption , and these two processes together make up the total absorption ...
Page 13
As the wavelength of the incident beam is decreased below XX , the absorption
coefficient begins to decrease again ... At a wavelength of 1.0A , for example , the
incident quanta have more than enough energy to remove an electron from the ...
As the wavelength of the incident beam is decreased below XX , the absorption
coefficient begins to decrease again ... At a wavelength of 1.0A , for example , the
incident quanta have more than enough energy to remove an electron from the ...
Page 414
Here we are concerned mainly with the variation in counter behavior with
variation in x - ray wavelength . This variation is of no great importance in
diffractometer measurements , since all diffracted beams have the same
wavelength .
Here we are concerned mainly with the variation in counter behavior with
variation in x - ray wavelength . This variation is of no great importance in
diffractometer measurements , since all diffracted beams have the same
wavelength .
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |