Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 1
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown at the time . Unlike ordinary light , these ...
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown at the time . Unlike ordinary light , these ...
Page 456
Bernard Dennis Cullity. ( 6 ) X - Rays in Practice , by Wayne T. Sproull . ( McGraw - Hill Book Company , Inc. , New York , 1946. ) X - ray diffraction and radiography , with emphasis on their industrial applications . ( 7 ) An Introduction ...
Bernard Dennis Cullity. ( 6 ) X - Rays in Practice , by Wayne T. Sproull . ( McGraw - Hill Book Company , Inc. , New York , 1946. ) X - ray diffraction and radiography , with emphasis on their industrial applications . ( 7 ) An Introduction ...
Page 487
... x - rays used in diffraction . The important fact to note about electrons is that they are much less penetrating than x - rays . They are easily absorbed by air , which means that the specimen and the photographic plate on which the ...
... x - rays used in diffraction . The important fact to note about electrons is that they are much less penetrating than x - rays . They are easily absorbed by air , which means that the specimen and the photographic plate on which the ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosē counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone