Transmission Electron Microscopy: A Textbook for Materials Science. Diffraction. IIA textbook for a senior or first-year graduate introductory course. Focuses on the two questions of why a particular technique of transmission electron microscopy should be used, and how the principles and procedures should be put into practice. Provides a sound theoretical base without going into s |
Contents
Chapter Summary | 16 |
295 | 19 |
Chapter Preview | 35 |
14 | 36 |
14 | 43 |
Electron Sources | 67 |
8 | 117 |
The Instrument | 131 |
Obtaining CBED Patterns | 301 |
BF and | 349 |
Scattering and Diffraction | 358 |
Chapter Preview | 367 |
43 | 467 |
47 | 470 |
Chapter Preview | 483 |
The XEDSTEM Interface | 573 |
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Common terms and phrases
aberration analysis angle aperture astigmatism atoms beam tilt Bloch waves Bragg Bragg angle Bragg condition Bragg's Law bremsstrahlung C2 aperture calculated calibration camera length CBED patterns Chapter contrast cross section crystal defects define detector DF image diffracted beam diffraction pattern direct beam discuss disk dislocations edge EELS effect elastic scattering elec electron beam Electron Microscopy energy energy-loss equation Ewald sphere film focal plane focus foil fringes give holder HOLZ HRTEM image plane incident beam intensity interface ionization Kikuchi lines lenses magnification materials measure microanalysis microscope objective aperture objective lens optic axis parallel peak phase plasmon pump reciprocal lattice reflections rotation scanning semiangle semiconductor detector shown in Figure simulation spectrometer spectrum spherical aberration spots STEM image structure surface technique TEMS thickness thin specimen tilt tion trons vacuum vector voltage X-ray XEDS