Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis, Volume 9

absorption Advances in X-Ray alloys aluminum ammonium perchlorate analyzer angle anode approximately band beryllium boron calculated carbide carbon chemical composition compounds copper counter counting rate crystal curves deformation density detector determined diameter diffractometer dislocation effect electron emission energy equation excitation experimental film fluorescence Fluorine grains grating increase instrument K band laboratory lattice constants lead stearate material measured metal method microprobe nickel niobium observed obtained optical oxide oxygen parameter particle patterns peak perchlorate phase photographs Phys planes polarizer position powder probe proportional counter radiation range ratio reflection relative residual residual lattice resolution rotation rutile sample satellite scanning shift shown in Figure shows silicon soft X-ray specimen spectra spectrometer spectroscopy spectrum standard stoichiometry strain stress structure sulfur surface Table tantalum target techniques temperature titanium topograph transition unit cell uranium vacuum values wavelength width X-Ray Analysis X-ray beam X-ray diffraction X-ray tube zinc zones