Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis, Volume 10

absorption Al-Zn Al-Zn-Mg alloys aluminum amplitude annealed Appl atoms backscatter band Berg-Barrett beryllium boron boron carbide boundary Bragg angle Bragg condition Burgers vector calculated carbide chemical chromium coefficients collimator composition contrast copper correction cryostat crystallite deformation detector determined diffraction pattern diffractometer diffusion direction dislocation line edge effect elements emission energy equation excitation experimental factor film fluorescence fringes growth incident increase intensity K band lattice parameter layer magnesium material measured Metals method microprobe nickel observed obtained oxide parallel particle peak phase Phys plate pole figure position powder pulse height quenching radiation ratio reflecting planes region relative residual stresses ruby sample scanning secondary electron shown in Figure shows silicon single crystals slit stacking fault standard strain structure Table target technique thickness tion tube twin boundaries values vector voltage wave wave vectors wave-fields wavelength width window X-ray diffraction X-ray topographic yield zone