Introduction to Scanning Tunneling MicroscopyDue to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics. |
Contents
| xvii | |
Overview | 1 |
PART I | 51 |
Tunneling matrix elements | 75 |
Wavefunctions at surfaces | 91 |
Imaging crystalline surfaces | 121 |
Imaging atomic states | 149 |
Atomic forces and tunneling | 171 |
Electronics and control | 251 |
Coarse positioner and STM design | 269 |
Scanning tunneling spectroscopy | 295 |
Atomic force microscopy | 313 |
Appendix A Real wavefunctions | 343 |
Twodimensional Fourier series | 353 |
Shear stress and shear strain | 366 |
Appendix H Operational amplifiers | 379 |
Other editions - View all
Common terms and phrases
apex atom apparent barrier height atomic force atomic force microscopy atomic resolution atomic structure Bardeen beam bias Binnig Bloch Bloch functions cantilever Chapter charge density coefficients constant contour corrugation amplitude current amplifier curve dangling bonds deflection deformation diffraction effect electronic structure emission energy level example experimental feedback Feenstra Fermi level Fermi-level LDOS field-emission first-principles calculations Fourier graphite Green's function Hamann hydrogen molecular ion interaction jellium jellium model lattice Lett measured mechanical metal surfaces method molecules observed obtained op-amp permission perturbation Phys piezo piezoelectric piezoelectric effect plane groups plate quantum Rohrer s-wave sample surface sample wavefunction scanning tunneling microscopy scanning tunneling spectroscopy Schrödinger equation shown in Fig spherical STM and AFM STM experiments STM images symmetry temperature Tersoff theory tip wavefunction tip-sample distance topographic image tube scanner tunneling conductance tunneling current tunneling matrix element tunneling spectra tunneling spectroscopy typical voltage wavefunctions
Popular passages
Page 383 - TR Albrecht, S. Akamine, TE Carver, and CF Quate, "Microfabrication of cantilever styli for the atomic force microscope,
Page vi - The Frontiers of Knowledge (to coin a phrase) are always on the move. Today's discovery will tomorrow be part of the mental furniture of every research worker. By the end of next week it will be in every course of graduate lectures. Within the month there will be a clamour to have it in the undergraduate curriculum. Next year, I do believe, it will seem so commonplace that it may be assumed to be known by every schoolboy.