Scanning Probe Microscopy and Spectroscopy: Methods and ApplicationsThe investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, including topographic imaging, local tunneling barrier height measurements, tunneling spectroscopy, and local potentiometry. A treatment of the experimental techniques used in scanning force microscopy and other scanning probe techniques rounds out this section. The second part discusses representative applications of these techniques in fields such as condensed matter physics, chemistry, materials science, biology, and nanotechnology, so this book will be extremely valuable to upper-division students and researchers in these areas. |
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Contents
I | xv |
II | xix |
III | 1 |
IV | 11 |
V | 12 |
VI | 15 |
VII | 17 |
IX | 20 |
XCIV | 236 |
XCV | 239 |
XCVI | 241 |
XCVII | 245 |
XCVIII | 246 |
XCIX | 251 |
C | 265 |
CI | 267 |
X | 21 |
XI | 25 |
XII | 28 |
XIII | 30 |
XIV | 34 |
XV | 35 |
XVI | 36 |
XVII | 44 |
XVIII | 47 |
XIX | 49 |
XX | 55 |
XXII | 61 |
XXIII | 63 |
XXIV | 66 |
XXV | 68 |
XXVI | 73 |
XXVII | 81 |
XXVIII | 83 |
XXIX | 84 |
XXX | 87 |
XXXI | 91 |
XXXII | 97 |
XXXIII | 98 |
XXXIV | 99 |
XXXV | 106 |
XXXVI | 109 |
XXXIX | 128 |
XL | 130 |
XLIII | 131 |
XLIV | 134 |
XLV | 135 |
XLVI | 139 |
XLVII | 142 |
XLVIII | 145 |
XLIX | 147 |
L | 148 |
LI | 149 |
LII | 152 |
LIII | 153 |
LV | 157 |
LVI | 158 |
LVII | 163 |
LVIII | 164 |
LX | 165 |
LXI | 166 |
LXIII | 171 |
LXIV | 172 |
LXVI | 173 |
LXVII | 176 |
LXVIII | 177 |
LXIX | 179 |
LXX | 183 |
LXXII | 190 |
LXXVI | 193 |
LXXVII | 197 |
LXXVIII | 198 |
LXXIX | 204 |
LXXX | 210 |
LXXXI | 213 |
LXXXII | 214 |
LXXXIII | 216 |
LXXXV | 221 |
LXXXVI | 226 |
LXXXVIII | 227 |
XC | 229 |
XCI | 230 |
XCII | 231 |
XCIII | 235 |
CII | 268 |
CIII | 270 |
CIV | 272 |
CV | 273 |
CVI | 275 |
CVII | 276 |
CVIII | 278 |
CIX | 279 |
CX | 283 |
CXI | 284 |
CXIII | 286 |
CXIV | 289 |
CXV | 291 |
CXVI | 292 |
CXVIII | 293 |
CXIX | 357 |
CXX | 358 |
CXXI | 363 |
CXXIII | 387 |
CXXIV | 417 |
CXXV | 422 |
CXXVI | 423 |
CXXVII | 430 |
CXXVIII | 431 |
CXXIX | 434 |
CXXX | 439 |
CXXXI | 441 |
CXXXII | 443 |
CXXXIII | 452 |
CXXXIV | 454 |
CXXXV | 457 |
CXXXVI | 461 |
CXXXVII | 464 |
CXXXIX | 468 |
CXLI | 470 |
CXLII | 478 |
CXLIII | 481 |
CXLIV | 485 |
CXLV | 487 |
CXLVI | 488 |
CXLVII | 493 |
CXLIX | 495 |
CL | 496 |
CLI | 501 |
CLII | 510 |
CLIII | 512 |
CLIV | 518 |
CLVI | 521 |
CLVII | 525 |
CLVIII | 537 |
CLIX | 539 |
CLX | 542 |
CLXII | 543 |
CLXIII | 545 |
CLXIV | 551 |
CLXVI | 558 |
CLXVII | 562 |
CLXVIII | 567 |
CLXIX | 569 |
CLXX | 571 |
CLXXI | 574 |
CLXXII | 575 |
CLXXIV | 576 |
CLXXVI | 579 |
CLXXVII | 580 |
CLXXVIII | 581 |
625 | |
Other editions - View all
Scanning Probe Microscopy and Spectroscopy: Methods and Applications Roland Wiesendanger No preview available - 1994 |
Scanning Probe Microscopy and Spectroscopy: Methods and Applications Roland Wiesendanger No preview available - 1994 |
Common terms and phrases
adatoms adsorbed Ångström Appl applied bias voltage Avouris bias voltage Binnig cantilever contrast corrugation crystal dangling bonds defects density dependence dimer domain electrochemical electron tunneling electronic structure energy gap experimental Feenstra Fermi level ferromagnetic film frequency graphite Güntherodt Hamers Hansma insulating interaction interface laser lattice layer Lett magnetic measured metal mode molecular molecules nanometer observed obtained oxide photon Phys piezoelectric point contact polarization potential reconstruction Rohrer sample bias sample bias voltage sample surface scanning probe scanning probe microscopy scanning tunneling Scanning Tunneling Microscopy Schematic semiconductor sensor shown in Fig silicon spatial resolution spatial variations STM images STM studies STM tip substrate superconductors superlattice Surf surface structure techniques Technol temperature thermal tion tip and sample tip-sample tip-surface separation topographic tunnel junction tunneling barrier tunneling current tunneling spectroscopy typically unit cell vacuum wave functions Wiesendanger