Industrial Applications Of Electron Microscopy

Front Cover
Zhigang Li
CRC Press, Dec 4, 2002 - Science - 644 pages
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries
 

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Contents

Automotive Applications of Scanning and Transmission Electron Microscopy
1
Electron Microscopy for the Pulp and Paper Industry
33
Applications of Electron Microscopy in Photographic Science and Technology
51
Characterization of Petroleum Catalysts by Electron Microscopy
113
Applications of Electron Microscopy for Defect Understanding in the Glass Industry
133
Applications of Electron Microscopy in the Semiconductor Industry Challenges and Solutions for Specimen Preparation
153
Electron Imaging in Pharmaceutical Research and Development
173
Electron Microscopy in Mineral Processing
187
Polymer Characterization Using Electron Microscopes
351
Carbon Nanotube and Its Application to Nanoelectronics
381
Electron Microscopy of Ceramic Materials
395
Applications of Electron Microscopy to HighTemperature Superconductors and Related Materials
415
Characterization of CVD Diamond Defects by UHREM
453
StructureFunction Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy
479
Principles of Electron Microscopy and Related Techniques
501
Digital Imaging in Electron Microscopy
527

Contributions of Microscopy to Advanced Industrial Materials and Processing
213
Museum Applications for SEM and XRay Microanalysis
255
Forensic Applications of Scanning Electron Microscopy with XRay Analysis
275
Electron Microscopy on Pigments
325
Electron EnergyLoss Spectroscopy and EnergyFiltered Electron Imaging
547
Electron Crystallography Structure Determination by HREM and Electron Diffraction
575
Index
607
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About the author (2002)

Zhigang R. Li is Senior Research Physicist, Du Pont Central Research and Development, Wilmington, Delaware. The author or coauthor of more than 70 professional publications and book chapters in the microstructural studies of magnetic, electronic, catalyst, pharamceutical, semiconducting, optical and superconducting materials, he is a member of the Microscopy Society of America. The recipient of the Sin-France Abroad Study Award (1982-1986) and the Kazato Research Foundation of Japan Award (1986), he received the B.S. degree (1982) in optics from the Beijing Institute of Technology, China, and the Ph.D. degree (1987) in physics from the Laboratoire d'Optique Electronique du C.N.R.S., Toulouse, France.

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