Industrial Applications Of Electron MicroscopyZhigang Li Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries |
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Page 7
... Figure 3 Wavelength - dispersive x - ray maps of Ni and Sr for a fresh and a dynamome- ter aged catalyst . 1. Thermal Aging Electron probe microanalyzer elemental distribution maps of fresh and aged cata- lyst show sintering of Ni- and ...
... Figure 3 Wavelength - dispersive x - ray maps of Ni and Sr for a fresh and a dynamome- ter aged catalyst . 1. Thermal Aging Electron probe microanalyzer elemental distribution maps of fresh and aged cata- lyst show sintering of Ni- and ...
Page 8
... Figure 5 Wavelength - dispersive x - ray maps showing migrations of Ba at the inlet of dy- namometer - aged sample . Ba ( a ) Fresh Ba P Figure 6 Wavelength - dispersive x - ray comparison of fresh and aged samples shows that barium has ...
... Figure 5 Wavelength - dispersive x - ray maps showing migrations of Ba at the inlet of dy- namometer - aged sample . Ba ( a ) Fresh Ba P Figure 6 Wavelength - dispersive x - ray comparison of fresh and aged samples shows that barium has ...
Page 13
... Figure 11. III . HEAT TREATMENT OF CAST ALUMINUM Figure 18 Transmission electron microscopy of 319 aluminum solution treated. ( c ) Figure 10 ( a ) Bright - field SEM image of oil poisoned catalyst . ( b ) EDX spectra from a region ...
... Figure 11. III . HEAT TREATMENT OF CAST ALUMINUM Figure 18 Transmission electron microscopy of 319 aluminum solution treated. ( c ) Figure 10 ( a ) Bright - field SEM image of oil poisoned catalyst . ( b ) EDX spectra from a region ...
Page 16
... Figure 14 shows an example of this analysis for an " as - cast " 110 - μm DAS sample . Figure 14a is a BSE image showing the locations of quan- titative line scans ( along the major and minor axes of the dendrites ) . Figure 14b shows ...
... Figure 14 shows an example of this analysis for an " as - cast " 110 - μm DAS sample . Figure 14a is a BSE image showing the locations of quan- titative line scans ( along the major and minor axes of the dendrites ) . Figure 14b shows ...
Page 18
... Figure 15 shows histograms for the " as - cast " condition ( 0 h solution treatment time ) for three different DASS . The effect of solution treatment time on the Cu content at the centers of den- drites is summarized in Fig . 16. The ...
... Figure 15 shows histograms for the " as - cast " condition ( 0 h solution treatment time ) for three different DASS . The effect of solution treatment time on the Cu content at the centers of den- drites is summarized in Fig . 16. The ...
Contents
1 | |
33 | |
Applications of Electron Microscopy in Photographic Science and Technology | 51 |
Characterization of Petroleum Catalysts by Electron Microscopy | 113 |
Applications of Electron Microscopy for Defect Understanding in the Glass Industry | 133 |
Applications of Electron Microscopy in the Semiconductor Industry Challenges and Solutions for Specimen Preparation | 153 |
Electron Imaging in Pharmaceutical Research and Development | 173 |
Electron Microscopy in Mineral Processing | 187 |
Polymer Characterization Using Electron Microscopes | 351 |
Carbon Nanotube and Its Application to Nanoelectronics | 381 |
Electron Microscopy of Ceramic Materials | 395 |
Applications of Electron Microscopy to HighTemperature Superconductors and Related Materials | 415 |
Characterization of CVD Diamond Defects by UHREM | 453 |
StructureFunction Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy | 479 |
Principles of Electron Microscopy and Related Techniques | 501 |
Digital Imaging in Electron Microscopy | 527 |
Contributions of Microscopy to Advanced Industrial Materials and Processing | 213 |
Museum Applications for SEM and XRay Microanalysis | 255 |
Forensic Applications of Scanning Electron Microscopy with XRay Analysis | 275 |
Electron Microscopy on Pigments | 325 |
Electron EnergyLoss Spectroscopy and EnergyFiltered Electron Imaging | 547 |
Electron Crystallography Structure Determination by HREM and Electron Diffraction | 575 |
Index | 607 |
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Common terms and phrases
AgBr analysis analytical applications atomic carbon carbon nanotubes catalyst cell ceramics characterization chemical coating composition contrast cross section crystal structure defects defocus detector determined diamond diffraction patterns digital image ectomycorrhizal edge EELS electron beam electron crystallography electron diffraction electron microprobe elements emulsion energy loss energy-filtered fibers focused ion beam forensic glass grain boundaries high-resolution HREM images HRTEM hyphae identified image processing industry intensity interaction interface ion beam laboratories lattice layer lift-out magnification materials matrix metal method microanalysis microcrystals micrograph Microsc microstructure mineral morphology Mycorrhiza nanotubes Oleshko optical oxide particles phase Phys pigments polymer quantitative region resolution sample scanning electron microscopy scattering shown in Figure shows silver halide specimen preparation spectra spectroscopy substrate superconductors surface techniques Technol thickness tilt tion transmission electron microscopy typically Ultramicroscopy voltage x-ray YBCO
Popular passages
Page 207 - F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Sr, Zr, Mo, Ag, Cd, Sn, Sb, Ba, Ce, Nd, Gd, Hf, Tl, Pb, and U.
Page 378 - A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, YH Lee, SG Kim, AG Rinzler, DT Colbert, GE Scuseria, D. Tomanek, JE Fischer, and RE Smalley, Science 273, 483-487 (1996).
Page 381 - We define ceramics as the art and science of making and using solid articles which have as their essential component, and are composed in large part of, inorganic, nonmetallic materials.
Page 168 - D. Barlage, R. Arghavani, G. Dewey, M. Doczy, B. Doyle, J. Kavalieros, A. Murthy, B. Roberds, P. Stokley, and R. Chau, "High-frequency response of 100 nm integrated CMOS transistors with high-K gate dielectrics," International Electron Devices Meeting.
Page 378 - SINANO), and the National Program for Tera-level Nano-devices of the Korea Ministry of Science and Technology as one of the 21st Century Frontier Programs.
Page 378 - J. Kong, NR Franklin, C. Zhou, MG Chapline, S. Peng, K. Cho, and H. Dai, "Nanotube molecular wires as chemical sensors", Science, vol.
Page xiii - Materials Science and Technology Division Los Alamos National Laboratory Los Alamos, New Mexico 87545...
References to this book
Organic Light-Emitting Materials and Devices Zhigang Li,Zhigang Rick Li,Hong Meng No preview available - 2006 |