Industrial Applications Of Electron MicroscopyZhigang Li Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries |
From inside the book
Results 1-5 of 71
Page 4
... determine the presence of specific phases in the washcoat or for crystallite size determination . X - ray radiography can give relative density measurements over the entire brick . The electron microprobe and TEM are used to study how ...
... determine the presence of specific phases in the washcoat or for crystallite size determination . X - ray radiography can give relative density measurements over the entire brick . The electron microprobe and TEM are used to study how ...
Page 5
... determine the spatial distribution of elements in the washcoat . When interpreting WDX element maps , absorption ... determining precious metal distribution in the cata- lyst washcoat . A. Catalyst Deactivation Studies Thermal aging and ...
... determine the spatial distribution of elements in the washcoat . When interpreting WDX element maps , absorption ... determining precious metal distribution in the cata- lyst washcoat . A. Catalyst Deactivation Studies Thermal aging and ...
Page 15
... determined by EDX analysis . ( b ) SAD pattern obtained from the area cir- cled in the BF image . The pattern indexes as Al2 ( SO4 ) 3 , with small amounts of y - alumina . important automotive alloy used for engine blocks and cylinder ...
... determined by EDX analysis . ( b ) SAD pattern obtained from the area cir- cled in the BF image . The pattern indexes as Al2 ( SO4 ) 3 , with small amounts of y - alumina . important automotive alloy used for engine blocks and cylinder ...
Page 18
... determine variation in the Cu composition with DAS and solu- tion treatment times ( 0 , 8 , and 100 h ) , the composition at the centers of between 50 and 200 dendrites was determined . To remove operator bias in selecting den- drites ...
... determine variation in the Cu composition with DAS and solu- tion treatment times ( 0 , 8 , and 100 h ) , the composition at the centers of between 50 and 200 dendrites was determined . To remove operator bias in selecting den- drites ...
Page 34
... determined . Bonds between the fluted medium and liner in corrugated board have been evaluated by SKU X480 0012 100U 1PST = Figure 2 Xerographic paper with mineral filler ; SEM . Scale bar 10μm . SEM . The collapse of individual fibers ...
... determined . Bonds between the fluted medium and liner in corrugated board have been evaluated by SKU X480 0012 100U 1PST = Figure 2 Xerographic paper with mineral filler ; SEM . Scale bar 10μm . SEM . The collapse of individual fibers ...
Contents
1 | |
33 | |
Applications of Electron Microscopy in Photographic Science and Technology | 51 |
Characterization of Petroleum Catalysts by Electron Microscopy | 113 |
Applications of Electron Microscopy for Defect Understanding in the Glass Industry | 133 |
Applications of Electron Microscopy in the Semiconductor Industry Challenges and Solutions for Specimen Preparation | 153 |
Electron Imaging in Pharmaceutical Research and Development | 173 |
Electron Microscopy in Mineral Processing | 187 |
Polymer Characterization Using Electron Microscopes | 351 |
Carbon Nanotube and Its Application to Nanoelectronics | 381 |
Electron Microscopy of Ceramic Materials | 395 |
Applications of Electron Microscopy to HighTemperature Superconductors and Related Materials | 415 |
Characterization of CVD Diamond Defects by UHREM | 453 |
StructureFunction Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy | 479 |
Principles of Electron Microscopy and Related Techniques | 501 |
Digital Imaging in Electron Microscopy | 527 |
Contributions of Microscopy to Advanced Industrial Materials and Processing | 213 |
Museum Applications for SEM and XRay Microanalysis | 255 |
Forensic Applications of Scanning Electron Microscopy with XRay Analysis | 275 |
Electron Microscopy on Pigments | 325 |
Electron EnergyLoss Spectroscopy and EnergyFiltered Electron Imaging | 547 |
Electron Crystallography Structure Determination by HREM and Electron Diffraction | 575 |
Index | 607 |
Other editions - View all
Common terms and phrases
AgBr analysis analytical applications atomic carbon carbon nanotubes catalyst cell ceramics characterization chemical coating composition contrast cross section crystal structure defects defocus detector determined diamond diffraction patterns digital image ectomycorrhizal edge EELS electron beam electron crystallography electron diffraction electron microprobe elements emulsion energy loss energy-filtered fibers focused ion beam forensic glass grain boundaries high-resolution HREM images HRTEM hyphae identified image processing industry intensity interaction interface ion beam laboratories lattice layer lift-out magnification materials matrix metal method microanalysis microcrystals micrograph Microsc microstructure mineral morphology Mycorrhiza nanotubes Oleshko optical oxide particles phase Phys pigments polymer quantitative region resolution sample scanning electron microscopy scattering shown in Figure shows silver halide specimen preparation spectra spectroscopy substrate superconductors surface techniques Technol thickness tilt tion transmission electron microscopy typically Ultramicroscopy voltage x-ray YBCO
Popular passages
Page 207 - F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Sr, Zr, Mo, Ag, Cd, Sn, Sb, Ba, Ce, Nd, Gd, Hf, Tl, Pb, and U.
Page 378 - A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, YH Lee, SG Kim, AG Rinzler, DT Colbert, GE Scuseria, D. Tomanek, JE Fischer, and RE Smalley, Science 273, 483-487 (1996).
Page 381 - We define ceramics as the art and science of making and using solid articles which have as their essential component, and are composed in large part of, inorganic, nonmetallic materials.
Page 168 - D. Barlage, R. Arghavani, G. Dewey, M. Doczy, B. Doyle, J. Kavalieros, A. Murthy, B. Roberds, P. Stokley, and R. Chau, "High-frequency response of 100 nm integrated CMOS transistors with high-K gate dielectrics," International Electron Devices Meeting.
Page 378 - SINANO), and the National Program for Tera-level Nano-devices of the Korea Ministry of Science and Technology as one of the 21st Century Frontier Programs.
Page 378 - J. Kong, NR Franklin, C. Zhou, MG Chapline, S. Peng, K. Cho, and H. Dai, "Nanotube molecular wires as chemical sensors", Science, vol.
Page xiii - Materials Science and Technology Division Los Alamos National Laboratory Los Alamos, New Mexico 87545...
References to this book
Organic Light-Emitting Materials and Devices Zhigang Li,Zhigang Rick Li,Hong Meng No preview available - 2006 |