Industrial Applications Of Electron MicroscopyZhigang Li Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries |
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Page 2
... metal such as gold , platinum , palladium , or chromium sputtered onto the surface . The choice of surface ... metals , whereas ion milling is utilized for most other inorganic materials . Chemical pol- ishing has also been utilized ...
... metal such as gold , platinum , palladium , or chromium sputtered onto the surface . The choice of surface ... metals , whereas ion milling is utilized for most other inorganic materials . Chemical pol- ishing has also been utilized ...
Page 3
... metal . Early washcoats were simple in composition , containing an Al2O3 support impregnated with finely dispersed noble metal particles ( initially Pt , but now Pd and Rh are also commonly used ) . As emission standards increased ...
... metal . Early washcoats were simple in composition , containing an Al2O3 support impregnated with finely dispersed noble metal particles ( initially Pt , but now Pd and Rh are also commonly used ) . As emission standards increased ...
Page 5
... metal particles leads to reduced surface area and reduced catalytic activity . Sintering of the ceramic support materials can en- trap catalyst metal particles , rendering them incapable of performing their cat- alytic function ...
... metal particles leads to reduced surface area and reduced catalytic activity . Sintering of the ceramic support materials can en- trap catalyst metal particles , rendering them incapable of performing their cat- alytic function ...
Page 7
... metal particles , these noble metal parti- cles are so small that they cannot be imaged by EPMA . In most cases , TEM also cannot identify the noble metal particles in fresh fully formulated catalyst because they are less than 5 nm and ...
... metal particles , these noble metal parti- cles are so small that they cannot be imaged by EPMA . In most cases , TEM also cannot identify the noble metal particles in fresh fully formulated catalyst because they are less than 5 nm and ...
Page 10
... metal or washcoat is another highly studied deactivation mechanism ( 7-10 ) . The oil addi- tives can build up on the surface of the washcoat or diffuse into the washcoat and lead to deactivation of the catalyst . Studying an oil ...
... metal or washcoat is another highly studied deactivation mechanism ( 7-10 ) . The oil addi- tives can build up on the surface of the washcoat or diffuse into the washcoat and lead to deactivation of the catalyst . Studying an oil ...
Contents
1 | |
33 | |
Applications of Electron Microscopy in Photographic Science and Technology | 51 |
Characterization of Petroleum Catalysts by Electron Microscopy | 113 |
Applications of Electron Microscopy for Defect Understanding in the Glass Industry | 133 |
Applications of Electron Microscopy in the Semiconductor Industry Challenges and Solutions for Specimen Preparation | 153 |
Electron Imaging in Pharmaceutical Research and Development | 173 |
Electron Microscopy in Mineral Processing | 187 |
Polymer Characterization Using Electron Microscopes | 351 |
Carbon Nanotube and Its Application to Nanoelectronics | 381 |
Electron Microscopy of Ceramic Materials | 395 |
Applications of Electron Microscopy to HighTemperature Superconductors and Related Materials | 415 |
Characterization of CVD Diamond Defects by UHREM | 453 |
StructureFunction Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy | 479 |
Principles of Electron Microscopy and Related Techniques | 501 |
Digital Imaging in Electron Microscopy | 527 |
Contributions of Microscopy to Advanced Industrial Materials and Processing | 213 |
Museum Applications for SEM and XRay Microanalysis | 255 |
Forensic Applications of Scanning Electron Microscopy with XRay Analysis | 275 |
Electron Microscopy on Pigments | 325 |
Electron EnergyLoss Spectroscopy and EnergyFiltered Electron Imaging | 547 |
Electron Crystallography Structure Determination by HREM and Electron Diffraction | 575 |
Index | 607 |
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Common terms and phrases
AgBr analysis analytical applications atomic carbon carbon nanotubes catalyst cell ceramics characterization chemical coating composition contrast cross section crystal structure defects defocus detector determined diamond diffraction patterns digital image ectomycorrhizal edge EELS electron beam electron crystallography electron diffraction electron microprobe elements emulsion energy loss energy-filtered fibers focused ion beam forensic glass grain boundaries high-resolution HREM images HRTEM hyphae identified image processing industry intensity interaction interface ion beam laboratories lattice layer lift-out magnification materials matrix metal method microanalysis microcrystals micrograph Microsc microstructure mineral morphology Mycorrhiza nanotubes Oleshko optical oxide particles phase Phys pigments polymer quantitative region resolution sample scanning electron microscopy scattering shown in Figure shows silver halide specimen preparation spectra spectroscopy substrate superconductors surface techniques Technol thickness tilt tion transmission electron microscopy typically Ultramicroscopy voltage x-ray YBCO
Popular passages
Page 207 - F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Sr, Zr, Mo, Ag, Cd, Sn, Sb, Ba, Ce, Nd, Gd, Hf, Tl, Pb, and U.
Page 378 - A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, YH Lee, SG Kim, AG Rinzler, DT Colbert, GE Scuseria, D. Tomanek, JE Fischer, and RE Smalley, Science 273, 483-487 (1996).
Page 381 - We define ceramics as the art and science of making and using solid articles which have as their essential component, and are composed in large part of, inorganic, nonmetallic materials.
Page 168 - D. Barlage, R. Arghavani, G. Dewey, M. Doczy, B. Doyle, J. Kavalieros, A. Murthy, B. Roberds, P. Stokley, and R. Chau, "High-frequency response of 100 nm integrated CMOS transistors with high-K gate dielectrics," International Electron Devices Meeting.
Page 378 - SINANO), and the National Program for Tera-level Nano-devices of the Korea Ministry of Science and Technology as one of the 21st Century Frontier Programs.
Page 378 - J. Kong, NR Franklin, C. Zhou, MG Chapline, S. Peng, K. Cho, and H. Dai, "Nanotube molecular wires as chemical sensors", Science, vol.
Page xiii - Materials Science and Technology Division Los Alamos National Laboratory Los Alamos, New Mexico 87545...
References to this book
Organic Light-Emitting Materials and Devices Zhigang Li,Zhigang Rick Li,Hong Meng No preview available - 2006 |