Industrial Applications Of Electron MicroscopyZhigang Li Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries |
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Page 3
... oxides of nitrogen . Most automotive exhaust catalysts consist of a multichanneled ceramic monolith made primarily of cordierite , Al3Mg2 ( Si , Al ) O18 ( Fig . 1 ) . The walls of the monolith are coated with a high - surface - area ...
... oxides of nitrogen . Most automotive exhaust catalysts consist of a multichanneled ceramic monolith made primarily of cordierite , Al3Mg2 ( Si , Al ) O18 ( Fig . 1 ) . The walls of the monolith are coated with a high - surface - area ...
Page 5
... oxides of Ce , Ba , La , Nd , and Pr are often found in catalysts , but have overlapping peaks in EDX ( Fig . 2 ) . When analyzing an aged sample with phosphorus poisoning , P ( Ka ) overlaps with Zr ( La ) ( a typical washcoat ...
... oxides of Ce , Ba , La , Nd , and Pr are often found in catalysts , but have overlapping peaks in EDX ( Fig . 2 ) . When analyzing an aged sample with phosphorus poisoning , P ( Ka ) overlaps with Zr ( La ) ( a typical washcoat ...
Page 22
... oxides and Fe - Si oxides . The NMTP in this area was imaged utilizing a very high gain setting for the BSE image ( Fig . 22b ) . This contrast ap- parently arises from electron channeling because the morphology of the marten- site is ...
... oxides and Fe - Si oxides . The NMTP in this area was imaged utilizing a very high gain setting for the BSE image ( Fig . 22b ) . This contrast ap- parently arises from electron channeling because the morphology of the marten- site is ...
Page 24
... Oxides a 10 μm b Figure 22 A cross section. Figure 21 Optical micrograph of a carburized 8620 - type alloy showing the carburized surface in cross section . Sample etched with 4 % nital . Figure 1 Facial tissue showing open structure ...
... Oxides a 10 μm b Figure 22 A cross section. Figure 21 Optical micrograph of a carburized 8620 - type alloy showing the carburized surface in cross section . Sample etched with 4 % nital . Figure 1 Facial tissue showing open structure ...
Page 25
... oxides present , both on prior austenite grain boundaries and within grains , a fine lamellar structure is also ... oxide particles , observed both within grains and along prior austenite grain boundaries , contained Mn and Cr ( Fig ...
... oxides present , both on prior austenite grain boundaries and within grains , a fine lamellar structure is also ... oxide particles , observed both within grains and along prior austenite grain boundaries , contained Mn and Cr ( Fig ...
Contents
1 | |
33 | |
Applications of Electron Microscopy in Photographic Science and Technology | 51 |
Characterization of Petroleum Catalysts by Electron Microscopy | 113 |
Applications of Electron Microscopy for Defect Understanding in the Glass Industry | 133 |
Applications of Electron Microscopy in the Semiconductor Industry Challenges and Solutions for Specimen Preparation | 153 |
Electron Imaging in Pharmaceutical Research and Development | 173 |
Electron Microscopy in Mineral Processing | 187 |
Polymer Characterization Using Electron Microscopes | 351 |
Carbon Nanotube and Its Application to Nanoelectronics | 381 |
Electron Microscopy of Ceramic Materials | 395 |
Applications of Electron Microscopy to HighTemperature Superconductors and Related Materials | 415 |
Characterization of CVD Diamond Defects by UHREM | 453 |
StructureFunction Relationships of Mycorrhizal Symbioses Revealed by Electron Microscopy | 479 |
Principles of Electron Microscopy and Related Techniques | 501 |
Digital Imaging in Electron Microscopy | 527 |
Contributions of Microscopy to Advanced Industrial Materials and Processing | 213 |
Museum Applications for SEM and XRay Microanalysis | 255 |
Forensic Applications of Scanning Electron Microscopy with XRay Analysis | 275 |
Electron Microscopy on Pigments | 325 |
Electron EnergyLoss Spectroscopy and EnergyFiltered Electron Imaging | 547 |
Electron Crystallography Structure Determination by HREM and Electron Diffraction | 575 |
Index | 607 |
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Common terms and phrases
AgBr analysis analytical applications atomic carbon carbon nanotubes catalyst cell ceramics characterization chemical coating composition contrast cross section crystal structure defects defocus detector determined diamond diffraction patterns digital image ectomycorrhizal edge EELS electron beam electron crystallography electron diffraction electron microprobe elements emulsion energy loss energy-filtered fibers focused ion beam forensic glass grain boundaries high-resolution HREM images HRTEM hyphae identified image processing industry intensity interaction interface ion beam laboratories lattice layer lift-out magnification materials matrix metal method microanalysis microcrystals micrograph Microsc microstructure mineral morphology Mycorrhiza nanotubes Oleshko optical oxide particles phase Phys pigments polymer quantitative region resolution sample scanning electron microscopy scattering shown in Figure shows silver halide specimen preparation spectra spectroscopy substrate superconductors surface techniques Technol thickness tilt tion transmission electron microscopy typically Ultramicroscopy voltage x-ray YBCO
Popular passages
Page 207 - F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Sr, Zr, Mo, Ag, Cd, Sn, Sb, Ba, Ce, Nd, Gd, Hf, Tl, Pb, and U.
Page 378 - A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, YH Lee, SG Kim, AG Rinzler, DT Colbert, GE Scuseria, D. Tomanek, JE Fischer, and RE Smalley, Science 273, 483-487 (1996).
Page 381 - We define ceramics as the art and science of making and using solid articles which have as their essential component, and are composed in large part of, inorganic, nonmetallic materials.
Page 168 - D. Barlage, R. Arghavani, G. Dewey, M. Doczy, B. Doyle, J. Kavalieros, A. Murthy, B. Roberds, P. Stokley, and R. Chau, "High-frequency response of 100 nm integrated CMOS transistors with high-K gate dielectrics," International Electron Devices Meeting.
Page 378 - SINANO), and the National Program for Tera-level Nano-devices of the Korea Ministry of Science and Technology as one of the 21st Century Frontier Programs.
Page 378 - J. Kong, NR Franklin, C. Zhou, MG Chapline, S. Peng, K. Cho, and H. Dai, "Nanotube molecular wires as chemical sensors", Science, vol.
Page xiii - Materials Science and Technology Division Los Alamos National Laboratory Los Alamos, New Mexico 87545...
References to this book
Organic Light-Emitting Materials and Devices Zhigang Li,Zhigang Rick Li,Hong Meng No preview available - 2006 |