Characterization of Catalytic Materials

Front Cover
Momentum Press, 2010 - Science - 202 pages
Catalytic materials are essential to nearly every commercial and industrial chemical process in order to make reaction times faster and more efficient. Understanding the microstructure of such materials is essential to designing improved catalytic properties. This volume in the materials characterization series reviews the more common types characterization methods used for understanding surface and structural properties of most types of commercially used catalytic materials.
  • Covers both bulk metals and alloys as well as supported metals metal oxides and metal sulfides
  • Characterization techniques for zeolites and molecular sieves as well as alumina pillared clays
  • Concise summaries of major characterization technologies for catalytic materials, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy

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Contents

1 Bulk Metals and Alloys
1
2 Supported Metals
17
3 Bulk Metal Oxides
47
4 Supported Metal Oxides
69
5 Bulk Metal Sulfides
89
6 Supported Metal Sulfides
109
7 Zeolites and Molecular Sieves
129
Methods of Preparation and Characterization
149
LowEnergy Electron Diffraction LEED
179
Mössbauer Spectroscopy
180
Neutron Activation Analysis NAA
181
Neutron Diffraction
182
Physical and Chemical Adsorption for the Measurement of Solid Surface Areas
183
Raman Spectroscopy
184
Scanning Electron Microscopy SEM
185
Scanning Transmission Electron Microscopy STEM
186

Technique Summaries
165
Auger Electron Spectroscopy AES
167
Dynamic Secondary Ion Mass Spectrometry DSIMS
168
Electron Energyloss Spectroscopy in the Transmission Electron Microscope EELS
169
Electron Paramagnetic Resonance Electron Spin Resonance
170
Electron Microprobe XRay Microanalysis EPMA
171
EnergyDispersive XRay Spectroscopy EDS
172
Extended XRay Absorption Fine Structure EXAFS
173
Fourier Transform Infrared Spectroscopy FTIR
174
High Resolution Electron Energy Loss Spectroscopy HREELS
175
Inductively Coupled Plasma Mass Spectrometry ICPMS
176
Inductively Coupled PlasmaOptical Emission Spectroscopy ICPOES
177
Ion Scattering Spectroscopy ISS
178
Scanning Tunneling Microscopy and Scanning Force Microscopy STM and SFM
187
Solid State Nuclear Magnetic Resonance NMR
188
Static Secondary Ion Mass Spectrometry Static SIMS
189
Temperature Programmed Techniques
190
Transmission Electron Microscopy TEM
191
Ultraviolet Photoelectron Spectroscopy UPS
192
XRay Diffraction XRD
193
XRay Fluorescence XRF
194
XRay Photoelectron and Auger Electron Diffraction XRD and AED
195
XRay Photoelectron Spectroscopy XPS
196
Index
197
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About the author (2010)

Israel E. Wachs

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