Treatise on Materials Science and Technology, Volume 1 |
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Page 52
25 gives €1 / kTe ~ 0 . 8 and 1 for Sn and Ge , respectively . It also gives X * ~ 0 .
05 and 0 . 02 for Sn and Ge , respectively . This procedure illustrates the method
of evaluating & z / kTe and X * for a particular system ; however , the magnitudes
...
25 gives €1 / kTe ~ 0 . 8 and 1 for Sn and Ge , respectively . It also gives X * ~ 0 .
05 and 0 . 02 for Sn and Ge , respectively . This procedure illustrates the method
of evaluating & z / kTe and X * for a particular system ; however , the magnitudes
...
Page 153
As the Fourier coefficients are very sensitive to the details of the function , it is
very important for this technique that E ( 0 ) is accurately measured for many
values of 0 , otherwise this approach can give results which are wildly in error .
As the Fourier coefficients are very sensitive to the details of the function , it is
very important for this technique that E ( 0 ) is accurately measured for many
values of 0 , otherwise this approach can give results which are wildly in error .
Page 338
010 inches of the substrate . This has only just recently been proved by X - ray
textural studies as a function of distance from the substrate for different deposition
temperatures ( Shim , 1971 ) . At 500° C the randomness gives way within 0 .
010 inches of the substrate . This has only just recently been proved by X - ray
textural studies as a function of distance from the substrate for different deposition
temperatures ( Shim , 1971 ) . At 500° C the randomness gives way within 0 .
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addition alloys analysis angle applied approach associated assumed atoms average becomes bond boundary calculated complex composite concentration consider constants contribution crystal curvature curve decrease defined dependence deposition determined developed direction discussed displacement distance distribution dynamical effect elastic electron elements energy equal equation exist experimental fibers force fracture function given gives grain grain boundaries Group growth growth path illustrated increase indicate interaction interface internal friction interstitial iron laminate lattice layer length material matrix measured mechanism metal microstructural molecules nitrogen normal nucleation observed obtained occur oxygen particles peak phase plane position possible potential present produce properties region reinforcing relaxation respectively shown in Fig shows single Snoek peak solid solution strain strength stress structure substitutional surface Table temperature tungsten unit values volume waves
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 1 Treatise on Materials Science and Technology, ScienceDirect (Online service) |
| Editor | Herbert Herman |
| Publisher | Academic Press, 1972 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| Export Citation | BiBTeX EndNote RefMan |