Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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Page 106
... annealing the sample for 15 minutes at 70 ° C . 10 ° 101 • COLD • ANNEALED 10-2 103 10 10-5 . 0.01 0.02 0.03 0.04 0.05 NEUTRON MOMENTUM ( Å ̈1 ) Fig . 2. Reflectivity profile of a Langmuir - Blodgett film if 4 layers of H - CdA on ...
... annealing the sample for 15 minutes at 70 ° C . 10 ° 101 • COLD • ANNEALED 10-2 103 10 10-5 . 0.01 0.02 0.03 0.04 0.05 NEUTRON MOMENTUM ( Å ̈1 ) Fig . 2. Reflectivity profile of a Langmuir - Blodgett film if 4 layers of H - CdA on ...
Page 145
... annealing temperature is below the microphase separation transition temperature ( MST ) where a transition from an ... annealed at temperatures above the MST , recent neutron reflectivity studies [ 3 ] have shown that there is a ...
... annealing temperature is below the microphase separation transition temperature ( MST ) where a transition from an ... annealed at temperatures above the MST , recent neutron reflectivity studies [ 3 ] have shown that there is a ...
Page 487
... annealing temperature ( T ) was adjusted to keep T - Tg roughly the same for the two cases . Fig . 2a presents the experimental values of Rk , 4 for the DPS ( 720 ) : PS ( 910k ) sample before and after annealing at 103 ° C for 410 ...
... annealing temperature ( T ) was adjusted to keep T - Tg roughly the same for the two cases . Fig . 2a presents the experimental values of Rk , 4 for the DPS ( 720 ) : PS ( 910k ) sample before and after annealing at 103 ° C for 410 ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO