Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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Page 98
... reflectivity profile is a function of two variables , and A. Then two experimental methods can be used in neutron reflectometry . i ) In the classical method a monochromatic beam impinges upon the surface with an angle . A 0-20 scan is ...
... reflectivity profile is a function of two variables , and A. Then two experimental methods can be used in neutron reflectometry . i ) In the classical method a monochromatic beam impinges upon the surface with an angle . A 0-20 scan is ...
Page 140
... reflectivity profile of a P ( S - b - d - MMA ) diblock copolymer film annealed on a Si substrate for 72 hrs . at 170 ° C where the total copolymer molecular weight is 30,000 . The points are the measured reflectivity profile whereas ...
... reflectivity profile of a P ( S - b - d - MMA ) diblock copolymer film annealed on a Si substrate for 72 hrs . at 170 ° C where the total copolymer molecular weight is 30,000 . The points are the measured reflectivity profile whereas ...
Page 141
... reflectivity profile , indicated by the solid line in figure 1 , is obtained . The agreement between the calculated and measured reflectivity profile is very good over the entire k range and over 5.5 orders of the reflectivity ...
... reflectivity profile , indicated by the solid line in figure 1 , is obtained . The agreement between the calculated and measured reflectivity profile is very good over the entire k range and over 5.5 orders of the reflectivity ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO