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Page 16
The ingoing and outgoing neutron waves, each of wavelength XnCUffun, set up a
probe wave of wavelength Xpobc - The probe wavelength decreases with
increasing scattering angle, 28, and decreasing Vum The neutron wavelength
and ...
The ingoing and outgoing neutron waves, each of wavelength XnCUffun, set up a
probe wave of wavelength Xpobc - The probe wavelength decreases with
increasing scattering angle, 28, and decreasing Vum The neutron wavelength
and ...
Page 62
(1) cell 1' cell matrix ' Thus, the phase shift v is given by v - 2AbRA, (2) meaning
that it is directly dependent on the material contrast, the dimensions of the
scatterer and the neutron wavelength. If v « 1, the measurement Is in the
conventional ...
(1) cell 1' cell matrix ' Thus, the phase shift v is given by v - 2AbRA, (2) meaning
that it is directly dependent on the material contrast, the dimensions of the
scatterer and the neutron wavelength. If v « 1, the measurement Is in the
conventional ...
Page 98
The reflectivity profile is recorded as a function of the wavelength for wavelengths
shorter than the critical value Ac (eq.(S)). This TOF method is naturally used at
pulsed neutron sources, but also at some steady state reactors [8] (Table II).
The reflectivity profile is recorded as a function of the wavelength for wavelengths
shorter than the critical value Ac (eq.(S)). This TOF method is naturally used at
pulsed neutron sources, but also at some steady state reactors [8] (Table II).
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Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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Common terms and phrases
1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms boron Bragg peaks calculated composition concentration copolymer correlation decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content pair interactions particles phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement reflectivity profile residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering small angle neutron specimen spectrometer stoichiometry strain structure factor superconductivity Symp technique thermal values Vycor wafer wavelength width X-ray YBCO
Bibliographic information
| Title | Neutron Scattering for Materials Science: Volume 166 of Materials Research Society symposium proceedings, Materials Research Society symposium proceedings MRS Proceedings |
| Authors | S. M. Shapiro, J. D. Jorgensen |
| Editors | S. M. Shapiro, Simon C. Moss, J. D. Jorgensen |
| Contributors | Materials Research Society, Materials Research Society. Meeting, Argonne National Laboratory |
| Publisher | Materials Research Society, 1990 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| Length | 499 pages |
| Subjects | › › Science / Nanoscience Science / Nuclear Physics Science / Physics Science / Physics / Nuclear Technology & Engineering / Engineering (General) Technology & Engineering / Material Science Technology & Engineering / Materials Science |
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