## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

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Results 1-3 of 88

Page 12

or gaseous state , its mass

of the mass

are the weight fractions of elements 1 , 2 , etc. , in the substance and ( up ) , ( up )

2 ...

or gaseous state , its mass

**absorption**coefficient is simply the weighted averageof the mass

**absorption**coefficients of its constituent elements . If wį , W2 , etc. ,are the weight fractions of elements 1 , 2 , etc. , in the substance and ( up ) , ( up )

2 ...

Page 14

does the energy per quantum , as shown by the upper curve , thus causing the

more easily it passes through an absorber . When the wavelength is reduced just

...

does the energy per quantum , as shown by the upper curve , thus causing the

**absorption**coefficient to decrease , since the greater the energy of a quantum themore easily it passes through an absorber . When the wavelength is reduced just

...

Page 151

ray in the incident beam occurs along path such as AB ; at B a small fraction of

the incident energy is diffracted by a powder particle , and

diffracted beam occurs along the path BC . Similarly , for a high - angle reflection

...

ray in the incident beam occurs along path such as AB ; at B a small fraction of

the incident energy is diffracted by a powder particle , and

**absorption**of thisdiffracted beam occurs along the path BC . Similarly , for a high - angle reflection

...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray