Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 248
... BACK - REFLECTION FOCUSING CAMERAS The most precise measurement of lattice parameter is made in the back - reflection region , as discussed in greater detail in Chap . 13. The most suitable camera for ... Back-Reflection Focusing Cameras.
... BACK - REFLECTION FOCUSING CAMERAS The most precise measurement of lattice parameter is made in the back - reflection region , as discussed in greater detail in Chap . 13. The most suitable camera for ... Back-Reflection Focusing Cameras.
Page 648
... Back - reflection camera , 248 , 265–268 , 374 Back - reflection Laue camera , 264 Back - reflection Laue method , 107 single crystal orientation , 471-487 Back - reflection Laue pattern aluminum crystal , 477-479 stereographic ...
... Back - reflection camera , 248 , 265–268 , 374 Back - reflection Laue camera , 264 Back - reflection Laue method , 107 single crystal orientation , 471-487 Back - reflection Laue pattern aluminum crystal , 477-479 stereographic ...
Page 649
... back - reflection , 248 , 265–268 , 374 back - reflection Laue , 264 back - reflection pinhole , 410 Guinier , 248 , 258,259 , 561 Guinier - de Wolff , 259 high - pressure , 246 high - temperature , 245 integrating , 254 Laue , 264-265 ...
... back - reflection , 248 , 265–268 , 374 back - reflection Laue , 264 back - reflection pinhole , 410 Guinier , 248 , 258,259 , 561 Guinier - de Wolff , 259 high - pressure , 246 high - temperature , 245 integrating , 254 Laue , 264-265 ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray