Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 88
Page 50
Planes of a zone are planes which are all parallel to one line , called the zone
axis , and the zone , i.e. , the set of planes , is specified by giving the indices of
the zone axis . Such planes may have quite different indices and spacings , the
only ...
Planes of a zone are planes which are all parallel to one line , called the zone
axis , and the zone , i.e. , the set of planes , is specified by giving the indices of
the zone axis . Such planes may have quite different indices and spacings , the
only ...
Page 67
Two main kinds of twinning are distinguished , depending on whether the
symmetry operation is 180 ° rotation about an axis , called the twin axis , or
reflection across a plane , called the twin plane . The plane on which the two
parts of a ...
Two main kinds of twinning are distinguished , depending on whether the
symmetry operation is 180 ° rotation about an axis , called the twin axis , or
reflection across a plane , called the twin plane . The plane on which the two
parts of a ...
Page 511
The methods described below are called topographic , in the sense that the
diffraction " spot ” has a fine structure that is an image or map of the crystal
examined . To be topographic , a one - to - one correspondence must exist
between points ...
The methods described below are called topographic , in the sense that the
diffraction " spot ” has a fine structure that is an image or map of the crystal
examined . To be topographic , a one - to - one correspondence must exist
between points ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |