Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
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Page 223
6-29, a circuit basically similar to that of Fig. 6-28(a) and having a time constant
R.C. S, shown as a simple switch, is actually an electronic circuit which connects
a to c each time a pulse arrives and then connects b to c immediately afterwards.
6-29, a circuit basically similar to that of Fig. 6-28(a) and having a time constant
R.C. S, shown as a simple switch, is actually an electronic circuit which connects
a to c each time a pulse arrives and then connects b to c immediately afterwards.
Page 224
average counting rate Figure 6-30 Effect of time constant (T.C.) on recorded
fluctuations in counting rate at constant x-ray intensity (schematic). Time
constants changed abruptly at times shown. (T.C.), “ (T.C.), “ (TC), Probable error
= 67 percent ...
average counting rate Figure 6-30 Effect of time constant (T.C.) on recorded
fluctuations in counting rate at constant x-ray intensity (schematic). Time
constants changed abruptly at times shown. (T.C.), “ (T.C.), “ (TC), Probable error
= 67 percent ...
Page 225
time constants are used with the higher scales, just as short counting times are
used with a scaler when the counting rate is high. In some instruments, the time
constant appropriate to each scale is fixed by the manufacturer, and in others the
...
time constants are used with the higher scales, just as short counting times are
used with a scaler when the counting rate is high. In some instruments, the time
constant appropriate to each scale is fixed by the manufacturer, and in others the
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |