Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 84
Page 165
4-3 Consider a hypothetical element whose structure can be based on either of
the following : a ) Cell A , base - centered tetragonal containing two atoms per
cell , at 000 and 120 , for which a = 28 and c = 3Å ; b ) Cell B ; simple tetragonal
with ...
4-3 Consider a hypothetical element whose structure can be based on either of
the following : a ) Cell A , base - centered tetragonal containing two atoms per
cell , at 000 and 120 , for which a = 28 and c = 3Å ; b ) Cell B ; simple tetragonal
with ...
Page 275
For example , if a sample contains the compound A , B , the diffraction method
will disclose the presence of A , B , as such , whereas ordinary chemical analysis
would show only the presence of elements A and B. Furthermore , if the sample ...
For example , if a sample contains the compound A , B , the diffraction method
will disclose the presence of A , B , as such , whereas ordinary chemical analysis
would show only the presence of elements A and B. Furthermore , if the sample ...
Page 442
If the specimen contains only applied stress , d , can be obtained from a
measurement on the unloaded specimen . ( Such a stress measurement is rarely
made , and then only for certain research purposes ; it is far easier to measure
applied ...
If the specimen contains only applied stress , d , can be obtained from a
measurement on the unloaded specimen . ( Such a stress measurement is rarely
made , and then only for certain research purposes ; it is far easier to measure
applied ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |