Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 198
... detector causes a voltage pulse in the detector output . Pulses from the detector then enter some very complex electronic circuitry , consisting of one or more pulse amplifiers , pulse shapers , etc. and , at the end , a scaler or ...
... detector causes a voltage pulse in the detector output . Pulses from the detector then enter some very complex electronic circuitry , consisting of one or more pulse amplifiers , pulse shapers , etc. and , at the end , a scaler or ...
Page 208
... detector can operate at rates as high as 10ʻ counts per second without losses . The correct detector voltage is found by the method used for the proportional counter , by plotting counting rate vs. voltage ( Fig . 6-19 ) . As in the ...
... detector can operate at rates as high as 10ʻ counts per second without losses . The correct detector voltage is found by the method used for the proportional counter , by plotting counting rate vs. voltage ( Fig . 6-19 ) . As in the ...
Page 210
... detector and FET preamplifier , very schematic . Both are in a cooled evacuated space , and x - rays enter through a beryllium window . The detector is operated at about 1000 volts . electron , # = hole . =A major disadvantage of the Si ...
... detector and FET preamplifier , very schematic . Both are in a cooled evacuated space , and x - rays enter through a beryllium window . The detector is operated at about 1000 volts . electron , # = hole . =A major disadvantage of the Si ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray