Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Results 1-3 of 43
Page 267
... diffraction spots and the background , since the coherent scattering , which ... spot may be increased by means of an intensifying screen , as used in ... diffraction spot formed by an obliquely incident beam to be larger than the cross ...
... diffraction spots and the background , since the coherent scattering , which ... spot may be increased by means of an intensifying screen , as used in ... diffraction spot formed by an obliquely incident beam to be larger than the cross ...
Page 490
... diffraction spot may be plotted stereographically . The projection plane is tangent to the sphere at the point I of Fig . 16-14 , and the projection is made from the point O. This requires that the film be read from the side facing the ...
... diffraction spot may be plotted stereographically . The projection plane is tangent to the sphere at the point I of Fig . 16-14 , and the projection is made from the point O. This requires that the film be read from the side facing the ...
Page 581
... diffraction spot G and the deficient or hki Kikuchi line passes through the incident beam spot 0. If the sample is rotated so that the direct beam is exactly parallel to ( hkl ) , the hkl and hki Kikuchi lines are symmetrically ...
... diffraction spot G and the deficient or hki Kikuchi line passes through the incident beam spot 0. If the sample is rotated so that the direct beam is exactly parallel to ( hkl ) , the hkl and hki Kikuchi lines are symmetrically ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray