## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

### From inside the book

Results 1-3 of 82

Page 315

Te Interatomic

” Cd - Te interatomic

closest approach in the pure elements . In doing this , the atoms are treated as ...

Te Interatomic

**distance**is therefore a / 4 = 2.80 Å . For comparison a “ theoretical” Cd - Te interatomic

**distance**can be found simply by averaging the**distances**ofclosest approach in the pure elements . In doing this , the atoms are treated as ...

Page 486

The

( 16-4 ) and ( 16-6 ) , and marked off from the center of the ruler in the opposite

direction . Corresponding graduations are given the same number and the result

...

The

**distance**PQ corresponding to each**distance**OS is then calculated from Eqs .( 16-4 ) and ( 16-6 ) , and marked off from the center of the ruler in the opposite

direction . Corresponding graduations are given the same number and the result

...

Page 587

TTt Ieft TTt & g ( 20-6 ) ( TTTS etd ) ? where 1 , is the intensity of the incident

beam , t is thickness of the sample through which the electrons have traveled , $

g is a constant called the extinction

Jeff ...

TTt Ieft TTt & g ( 20-6 ) ( TTTS etd ) ? where 1 , is the intensity of the incident

beam , t is thickness of the sample through which the electrons have traveled , $

g is a constant called the extinction

**distance**and has units of inverse length andJeff ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray