Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 82
Page 315
Te Interatomic distance is therefore a / 4 = 2.80 Å . For comparison a “ theoretical
” Cd - Te interatomic distance can be found simply by averaging the distances of
closest approach in the pure elements . In doing this , the atoms are treated as ...
Te Interatomic distance is therefore a / 4 = 2.80 Å . For comparison a “ theoretical
” Cd - Te interatomic distance can be found simply by averaging the distances of
closest approach in the pure elements . In doing this , the atoms are treated as ...
Page 486
The distance PQ corresponding to each distance OS is then calculated from Eqs .
( 16-4 ) and ( 16-6 ) , and marked off from the center of the ruler in the opposite
direction . Corresponding graduations are given the same number and the result
...
The distance PQ corresponding to each distance OS is then calculated from Eqs .
( 16-4 ) and ( 16-6 ) , and marked off from the center of the ruler in the opposite
direction . Corresponding graduations are given the same number and the result
...
Page 587
The extinction distance & can be regarded as a characteristic length for diffraction
vector g , and this scalar quantity is given by Ég = ( TV . cos Ob ) / ( AFg ) ( 20-8 )
The value of & , depends on the lattice parameter ( s ) of the specimen through ...
The extinction distance & can be regarded as a characteristic length for diffraction
vector g , and this scalar quantity is given by Ég = ( TV . cos Ob ) / ( AFg ) ( 20-8 )
The value of & , depends on the lattice parameter ( s ) of the specimen through ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |