Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 241
However , the emulsion on ordinary film is too thin to absorb much of the incident
X - radiation , and only absorbed x - rays ... For this reason , x - ray films are made
with rather thick layers of emulsion on both sides in order to increase the total ...
However , the emulsion on ordinary film is too thin to absorb much of the incident
X - radiation , and only absorbed x - rays ... For this reason , x - ray films are made
with rather thick layers of emulsion on both sides in order to increase the total ...
Page 243
This reusable x - ray “ film ” has a dynamic range of five orders of magnitude ,
which is , as discussed in Chap . 6 , comparable to that of electronic detectors .
Image plates are also much faster than x - ray film , typically 35 times faster than ...
This reusable x - ray “ film ” has a dynamic range of five orders of magnitude ,
which is , as discussed in Chap . 6 , comparable to that of electronic detectors .
Image plates are also much faster than x - ray film , typically 35 times faster than ...
Page 472
Wire or rod specimens are best mounted with their axis parallel to one edge of
the square or rectangular film ; a fiducial mark on the specimen surface , for
example on the side nearest the film , then fixes the orientation of the specimen ...
Wire or rod specimens are best mounted with their axis parallel to one edge of
the square or rectangular film ; a fiducial mark on the specimen surface , for
example on the side nearest the film , then fixes the orientation of the specimen ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |