Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
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Page 241
In cameras such screens often find use as intensifiers for photographic emulsions
, Photographic Film Photographic film is affected by x-rays in much the same way
as by visible light. However, the emulsion on ordinary film is too thin to absorb ...
In cameras such screens often find use as intensifiers for photographic emulsions
, Photographic Film Photographic film is affected by x-rays in much the same way
as by visible light. However, the emulsion on ordinary film is too thin to absorb ...
Page 243
This reusable x-ray “film” has a dynamic range of five orders of magnitude, which
is, as discussed in Chap. 6, comparable to that of electronic detectors. Image
plates are also much faster than x-ray film, typically 35 times faster than Polaroid
...
This reusable x-ray “film” has a dynamic range of five orders of magnitude, which
is, as discussed in Chap. 6, comparable to that of electronic detectors. Image
plates are also much faster than x-ray film, typically 35 times faster than Polaroid
...
Page 472
In either case, since the orientation of the specimen is to be determined from the
location of the Laue spots on the film, it is necessary to orient the specimen
relative to the film in some known manner. The single crystal specimens
encountered ...
In either case, since the orientation of the specimen is to be determined from the
location of the Laue spots on the film, it is necessary to orient the specimen
relative to the film in some known manner. The single crystal specimens
encountered ...
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |