## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

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Results 1-3 of 71

Page 37

Determining the Miller

following steps . 48 1Å SÅ 48 ЗА 3Å Axial lengths Intercept lengths Fractional

intercepts Miller

...

Determining the Miller

**indices**of the plane shown in Fig . 2-4 ( b ) requires thefollowing steps . 48 1Å SÅ 48 ЗА 3Å Axial lengths Intercept lengths Fractional

intercepts Miller

**indices**1/4 1 1/2 2 4 1 As stated earlier , if a plane is parallel to a...

Page 50

Planes of a zone are planes which are all parallel to one line , called the zone

axis , and the zone , i.e. , the set of planes , is specified by giving the

the zone axis . Such planes may have quite different

only ...

Planes of a zone are planes which are all parallel to one line , called the zone

axis , and the zone , i.e. , the set of planes , is specified by giving the

**indices**ofthe zone axis . Such planes may have quite different

**indices**and spacings , theonly ...

Page 52

Stock. that it is often used in conjunction with the other two . Thus the

plane in the hexagonal system , called Miller - Bravais

and are written ( hkil ) . The index i is the reciprocal of the fractional intercept on ...

Stock. that it is often used in conjunction with the other two . Thus the

**indices**of aplane in the hexagonal system , called Miller - Bravais

**indices**, refer to four axesand are written ( hkil ) . The index i is the reciprocal of the fractional intercept on ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray