Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 90
Page 126
It therefore gives rise to a scattered beam whose intensity at P is found from Eq . (
4-1 ) to be K Ipy = loy p2 ° since a = 4yOP ... The total scattered intensity at P is
obtained by summing the intensities of these two scattered components : ܐܟ Ip
...
It therefore gives rise to a scattered beam whose intensity at P is found from Eq . (
4-1 ) to be K Ipy = loy p2 ° since a = 4yOP ... The total scattered intensity at P is
obtained by summing the intensities of these two scattered components : ܐܟ Ip
...
Page 196
slita line source slit b inclination of the specimen surface to the incident beam ,
but in back reflection an increase in divergence angle to 3 or 4 ° will increase the
area irradiated and the diffracted intensity . But if line intensities are to be ...
slita line source slit b inclination of the specimen surface to the incident beam ,
but in back reflection an increase in divergence angle to 3 or 4 ° will increase the
area irradiated and the diffracted intensity . But if line intensities are to be ...
Page 348
12-3 BASIC PRINCIPLES OF MULTIPHASE QUANTITATIVE ANALYSIS
Quantitative analysis by diffraction is based on the fact that the intensity of the
diffraction pattern of a particular phase in a mixture of phases depends on the
concentration ...
12-3 BASIC PRINCIPLES OF MULTIPHASE QUANTITATIVE ANALYSIS
Quantitative analysis by diffraction is based on the fact that the intensity of the
diffraction pattern of a particular phase in a mixture of phases depends on the
concentration ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |