## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

### From inside the book

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Page 276

The collection of

and then pattern - by - pattern comparison in order to find a matching one

becomes out of the question . What is needed is a system of classifying the

The collection of

**known**patterns has to be fairly large , if it is to be at all useful ,and then pattern - by - pattern comparison in order to find a matching one

becomes out of the question . What is needed is a system of classifying the

**known**...Page 309

10-7 DETERMINATION OF ATOM POSITIONS To find the positions of a

number of atoms in a unit cell of

observed relative intensities of the diffracted beams , since these intensities are ...

10-7 DETERMINATION OF ATOM POSITIONS To find the positions of a

**known**number of atoms in a unit cell of

**known**shape and size , are required , theobserved relative intensities of the diffracted beams , since these intensities are ...

Page 310

From these

starting point . Analysis proceeds on the assumption that this unknown structure

is the same as , or very similar to , one of these

From these

**known**structures a few likely candidates , may be selected as astarting point . Analysis proceeds on the assumption that this unknown structure

is the same as , or very similar to , one of these

**known**ones . A great many**known**...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray