Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Results 1-3 of 58
Page 56
... layer , so that the layer stacking sequence can be summarized as ABABAB .... The first two atom layers of an FCC metal are put down in the same way , but the atoms of the third layer are so placed in the hollows of the second layer that ...
... layer , so that the layer stacking sequence can be summarized as ABABAB .... The first two atom layers of an FCC metal are put down in the same way , but the atoms of the third layer are so placed in the hollows of the second layer that ...
Page 66
... layer or a B - layer , respectively . The asterisk in the previous sentence is used to indicate the position of the stacking fault . In the hcp system , the stacking sequence ... ABABABAB ... can become ABABA'CBCBCB ... Faults producing ...
... layer or a B - layer , respectively . The asterisk in the previous sentence is used to indicate the position of the stacking fault . In the hcp system , the stacking sequence ... ABABABAB ... can become ABABA'CBCBCB ... Faults producing ...
Page 536
... layer and a 40 period AlGaAs / InGaAs superlattice ( 17.47 ) . Recording two 224 - type reciprocal space maps gives ... layer and the substrate . The left side of the broad peak is the top of the graded layer , and the substrate peak is ...
... layer and a 40 period AlGaAs / InGaAs superlattice ( 17.47 ) . Recording two 224 - type reciprocal space maps gives ... layer and the substrate . The left side of the broad peak is the top of the graded layer , and the substrate peak is ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray