Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 61
Page 91
Differences in the length of the path traveled lead to differences in phase . 2. The
introduction of phase differences produces a change in amplitude . The greater
the path difference , the greater the difference in phase , since the path difference
...
Differences in the length of the path traveled lead to differences in phase . 2. The
introduction of phase differences produces a change in amplitude . The greater
the path difference , the greater the difference in phase , since the path difference
...
Page 147
The difference in path length for rays l ' and 2 ' scattered by adjacent atoms is
given by 012 AD - CB = a cos 02 a cos 0 a [ cos ( 08 10 ) – cos ( 8 + 10 ) ] . By
expanding the cosine terms and setting sin Ao equal to A8 , since the latter is
small ...
The difference in path length for rays l ' and 2 ' scattered by adjacent atoms is
given by 012 AD - CB = a cos 02 a cos 0 a [ cos ( 08 10 ) – cos ( 8 + 10 ) ] . By
expanding the cosine terms and setting sin Ao equal to A8 , since the latter is
small ...
Page 348
2μ Here Inkz = integrated intensity per unit length of diffraction line ( joules sec- '
m " ) , 1 , intensity of incident beam ( joules sec1 m2 ) , A = cross - sectional area
of incident beam ( mo ) , d = wavelength of incident beam ( m ) , r = radius of ...
2μ Here Inkz = integrated intensity per unit length of diffraction line ( joules sec- '
m " ) , 1 , intensity of incident beam ( joules sec1 m2 ) , A = cross - sectional area
of incident beam ( mo ) , d = wavelength of incident beam ( m ) , r = radius of ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |