Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 86
... located at 0 { 0,20 . b ) Four atoms of the same kind per unit cell located at 00z , o ¿ z , į ( į + z ) , 00 ( 1 + z ) . c ) Four atoms of the same kind per unit cell located at xyz , x y z , ( į + x ) ( į – y ) z , ( 1 - x ) ( + y ) z ...
... located at 0 { 0,20 . b ) Four atoms of the same kind per unit cell located at 00z , o ¿ z , į ( į + z ) , 00 ( 1 + z ) . c ) Four atoms of the same kind per unit cell located at xyz , x y z , ( į + x ) ( į – y ) z , ( 1 - x ) ( + y ) z ...
Page 165
... located in the following positions : 000 iżo żo į 01 0 111 4 4 4 2 2 3 3 1 4 4 4 3 1 3 4 4 4 1 3 3 4 4 4 4-5 A certain tetragonal crystal has four atoms of the same kind per unit cell , located at 021,20 4,20 } , 022 . ( Do not change ...
... located in the following positions : 000 iżo żo į 01 0 111 4 4 4 2 2 3 3 1 4 4 4 3 1 3 4 4 4 1 3 3 4 4 4 4-5 A certain tetragonal crystal has four atoms of the same kind per unit cell , located at 021,20 4,20 } , 022 . ( Do not change ...
Page 490
... located on the same side of the crystal as the film and , accordingly , the film must be read with its cut corner in the upper left - hand position . Whether the chart or the ruler is used to plot the poles of diffraction planes , they ...
... located on the same side of the crystal as the film and , accordingly , the film must be read with its cut corner in the upper left - hand position . Whether the chart or the ruler is used to plot the poles of diffraction planes , they ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray