Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 85
Page 165
Plot the 20 values of these lines in the manner of Fig 10-2 , and label each line
with its indices relative to Cell A and Cell B. Draw the two cells in the proper
relation to one another , and show that the indices of any one observed line ,
other ...
Plot the 20 values of these lines in the manner of Fig 10-2 , and label each line
with its indices relative to Cell A and Cell B. Draw the two cells in the proper
relation to one another , and show that the indices of any one observed line ,
other ...
Page 282
The 331 line ( d = 1.294 Å ) listed on the file card is not observed . However , its
intensity is expected to be very low . 3. Two high - angle lines ( d = 0.79 and 0.78
Å ) are observed but are not listed on the PDF card . Often the file cards ' data do
...
The 331 line ( d = 1.294 Å ) listed on the file card is not observed . However , its
intensity is expected to be very low . 3. Two high - angle lines ( d = 0.79 and 0.78
Å ) are observed but are not listed on the PDF card . Often the file cards ' data do
...
Page 313
NaCl is ionic and in ZnS covalent , since both kinds of bonding have been
observed in telluride structures . The next step is to calculate relative diffracted
intensities for each structure and compare them with experiment , in order to
determine ...
NaCl is ionic and in ZnS covalent , since both kinds of bonding have been
observed in telluride structures . The next step is to calculate relative diffracted
intensities for each structure and compare them with experiment , in order to
determine ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |