Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
From inside the book
Results 1-3 of 81
Page 160
Column 9: Obtained from the relation F = 16f. Column 10: Obtained from
Appendix 13. Column /1: Obtained from Appendix ... The agreement obtained
here between observed and calculated intensities is satisfactory. Note how the
value of the ...
Column 9: Obtained from the relation F = 16f. Column 10: Obtained from
Appendix 13. Column /1: Obtained from Appendix ... The agreement obtained
here between observed and calculated intensities is satisfactory. Note how the
value of the ...
Page 255
7-10 MICROBEAMS AND MICROCAMERAS Sometimes one has only a minute
amount of material from which a diffraction pattern has to be obtained. Or one
may wish to obtain a pattern from only a very small region of a large specimen.
7-10 MICROBEAMS AND MICROCAMERAS Sometimes one has only a minute
amount of material from which a diffraction pattern has to be obtained. Or one
may wish to obtain a pattern from only a very small region of a large specimen.
Page 352
The problem is to determine the composition of the mixture, when the two phases
have the same composition but different crystal structure. The external standard
method cannot be used, because it is usually impossible to obtain a reference ...
The problem is to determine the composition of the mixture, when the two phases
have the same composition but different crystal structure. The external standard
method cannot be used, because it is usually impossible to obtain a reference ...
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |