## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

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Page 36

But a difficulty then arises when the given

crystallographic axis , because such a

" intercept ” can only be described as “ infinity . ” To avoid the introduction of

infinity into the ...

But a difficulty then arises when the given

**plane**is parallel to a certaincrystallographic axis , because such a

**plane**does not intercept that axis , i.e. , its" intercept ” can only be described as “ infinity . ” To avoid the introduction of

infinity into the ...

Page 37

If a

with a bar over it .

parallel and lie on opposite sides of the origin , e.g. , ( 210 ) and ( 210 ) .

If a

**plane**cuts a negative axis , the corresponding index is negative and is writtenwith a bar over it .

**Planes**whose indices are the negatives of one another areparallel and lie on opposite sides of the origin , e.g. , ( 210 ) and ( 210 ) .

Page 67

The

composition

may not coincide with the twin

with ...

The

**plane**on which the two parts of a twinned crystal are united is called thecomposition

**plane**. In the case of a reflection twin , the composition**plane**may ormay not coincide with the twin

**plane**. Of most interest to those who deal mainlywith ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray