Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 203
wire cathode anode insulator X - rays th h window Ri to counting circuit + Figure
6-17 Gas counter ( proportional or Geiger ) and basic circuit connections .
sources . In this case the low sensitivity of ionization chambers is an advantage .
wire cathode anode insulator X - rays th h window Ri to counting circuit + Figure
6-17 Gas counter ( proportional or Geiger ) and basic circuit connections .
sources . In this case the low sensitivity of ionization chambers is an advantage .
Page 208
The correct detector voltage is found by the method used for the proportional
counter , by plotting counting rate vs. voltage ( Fig . 6-19 ) . As in the proportional
counter , the pulses produced in a scintillation detector have sizes proportional to
...
The correct detector voltage is found by the method used for the proportional
counter , by plotting counting rate vs. voltage ( Fig . 6-19 ) . As in the proportional
counter , the pulses produced in a scintillation detector have sizes proportional to
...
Page 211
This statistical variation in the number of charge carriers created by X - ray
absorption is the basic reason for the finite width W of the pulse distribution , and
the same is true of proportional counters and scintillation detectors . In the Si ( Li )
FET ...
This statistical variation in the number of charge carriers created by X - ray
absorption is the basic reason for the finite width W of the pulse distribution , and
the same is true of proportional counters and scintillation detectors . In the Si ( Li )
FET ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |