Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 213
... Pulse - Height Analyzer 1 1 1 This instrument discriminates against any pulses smaller than V , volts ( Fig . 6-24 ) . In addition , it contains an anti - coincidence circuit that rejects any pulse larger than V2 , because such a pulse ...
... Pulse - Height Analyzer 1 1 1 This instrument discriminates against any pulses smaller than V , volts ( Fig . 6-24 ) . In addition , it contains an anti - coincidence circuit that rejects any pulse larger than V2 , because such a pulse ...
Page 214
... pulses of average size Vep = k ( E2 - E2 ) = k ( 17.4 - 12.6 ) = 4.8 k volts . These two processes are illustrated in Fig . 6-25 ( a ) , where k is evidently about 1.9 . ( The term escape peak may be misleading to some . Note that the ...
... pulses of average size Vep = k ( E2 - E2 ) = k ( 17.4 - 12.6 ) = 4.8 k volts . These two processes are illustrated in Fig . 6-25 ( a ) , where k is evidently about 1.9 . ( The term escape peak may be misleading to some . Note that the ...
Page 219
... pulse to the second stage for every ten pulses that enter the first stage . In a five - stage scaler the fifth stage will have transmitted one pulse when 10 % pulses have entered the scaler , and the scaling factor is said to be 10 ...
... pulse to the second stage for every ten pulses that enter the first stage . In a five - stage scaler the fifth stage will have transmitted one pulse when 10 % pulses have entered the scaler , and the scaling factor is said to be 10 ...
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray