Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 56
Page 75
Drawing the stereographic projection on tracing paper is not only more
economical than drawing it directly on a Wulff net , but it also allows
differentiation between the frame of reference of the crystal ( represented by the
stereographic ...
Drawing the stereographic projection on tracing paper is not only more
economical than drawing it directly on a Wulff net , but it also allows
differentiation between the frame of reference of the crystal ( represented by the
stereographic ...
Page 358
The ratio 1/1 , provides one type of reference intensity for quantitative phase
determinations . Reference phases other than corundum , reflections other than
those with maximum intensity and arbitrary concentrations can be used , and this
...
The ratio 1/1 , provides one type of reference intensity for quantitative phase
determinations . Reference phases other than corundum , reflections other than
those with maximum intensity and arbitrary concentrations can be used , and this
...
Page 382
The variation of lattice parameters in the population of Si crystals serving as
references was surveyed by NIST using this type of comparator ; variations of da /
a on the order of 10 were found ( 13.11 ) . Triple axis diffractometry with a
reference ...
The variation of lattice parameters in the population of Si crystals serving as
references was surveyed by NIST using this type of comparator ; variations of da /
a on the order of 10 were found ( 13.11 ) . Triple axis diffractometry with a
reference ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |