## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

### From inside the book

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Page 75

Drawing the stereographic projection on tracing paper is not only more

economical than drawing it directly on a Wulff net , but it also allows

differentiation between the frame of

stereographic ...

Drawing the stereographic projection on tracing paper is not only more

economical than drawing it directly on a Wulff net , but it also allows

differentiation between the frame of

**reference**of the crystal ( represented by thestereographic ...

Page 358

The ratio 1/1 , provides one type of

determinations .

those with maximum intensity and arbitrary concentrations can be used , and this

...

The ratio 1/1 , provides one type of

**reference**intensity for quantitative phasedeterminations .

**Reference**phases other than corundum , reflections other thanthose with maximum intensity and arbitrary concentrations can be used , and this

...

Page 382

The variation of lattice parameters in the population of Si crystals serving as

a on the order of 10 were found ( 13.11 ) . Triple axis diffractometry with a

The variation of lattice parameters in the population of Si crystals serving as

**references**was surveyed by NIST using this type of comparator ; variations of da /a on the order of 10 were found ( 13.11 ) . Triple axis diffractometry with a

**reference**...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray