Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 86
Page 94
At first glance , the diffraction of x - rays by crystals and the reflection of visible
light by mirrors appear very similar , since in both phenomena the angle of
incidence is equal to the angle of reflection . It seems that the planes of atoms act
as little ...
At first glance , the diffraction of x - rays by crystals and the reflection of visible
light by mirrors appear very similar , since in both phenomena the angle of
incidence is equal to the angle of reflection . It seems that the planes of atoms act
as little ...
Page 432
14-2 For given values of 0 and y , which results in a greater effective depth of x -
ray penetration , a back - reflection pinhole camera or a diffractometer ? 14-3
Assume that the effective depth of penetration of an x - ray beam is that thickness
of ...
14-2 For given values of 0 and y , which results in a greater effective depth of x -
ray penetration , a back - reflection pinhole camera or a diffractometer ? 14-3
Assume that the effective depth of penetration of an x - ray beam is that thickness
of ...
Page 648
... Background radiation , 256 Back - reflection camera , 248 , 265–268 , 374
Back - reflection Laue camera , 264 Back - reflection Laue method , 107 single
crystal orientation , 471-487 Back - reflection Laue pattern aluminum crystal , 477
-479 ...
... Background radiation , 256 Back - reflection camera , 248 , 265–268 , 374
Back - reflection Laue camera , 264 Back - reflection Laue method , 107 single
crystal orientation , 471-487 Back - reflection Laue pattern aluminum crystal , 477
-479 ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |