## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

### From inside the book

Results 1-3 of 84

Page 47

For example , the existence of 4 - fold

cell requires that the cell edges be equal in length and at 90 ° to one another . On

the other hand , a tetragonal cell has only one 4 - fold axis , and this symmetry ...

For example , the existence of 4 - fold

**rotation**axes normal to the faces of a cubiccell requires that the cell edges be equal in length and at 90 ° to one another . On

the other hand , a tetragonal cell has only one 4 - fold axis , and this symmetry ...

Page 76

Note that the angle C - D equals the angle E - F , there being the same difference

in latitude between C and D as between E and F. If the two poles do not lie on a

great circle , then the projection is

...

Note that the angle C - D equals the angle E - F , there being the same difference

in latitude between C and D as between E and F. If the two poles do not lie on a

great circle , then the projection is

**rotated**relative to the Wulff net until they do lie...

Page 77

Any pole initially on NA S will be on NA S after a 60 °

angle between the initial and final ... N. )

plane of projection is accomplished by compounding

in ...

Any pole initially on NA S will be on NA S after a 60 °

**rotation**about NS , but theangle between the initial and final ... N. )

**Rotation**about an axis inclined to theplane of projection is accomplished by compounding

**rotations**about axes lyingin ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray