Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 84
Page 129
Partial interference occurs between the waves scattered by A and B , with the
result that the net amplitude of the wave ... A quantity f , the atomic scattering
factor , is used to describe the “ efficiency ” of scattering of a given atom in a given
...
Partial interference occurs between the waves scattered by A and B , with the
result that the net amplitude of the wave ... A quantity f , the atomic scattering
factor , is used to describe the “ efficiency ” of scattering of a given atom in a given
...
Page 130
4 SC Strictly , the scattering factors f tabulated in Appendix 12 apply only when
the scattered radiation has a wavelength much shorter than that of an absorption
edge of the scattering atom . When these two wavelengths are nearly the same ,
a ...
4 SC Strictly , the scattering factors f tabulated in Appendix 12 apply only when
the scattered radiation has a wavelength much shorter than that of an absorption
edge of the scattering atom . When these two wavelengths are nearly the same ,
a ...
Page 567
As the analyzer is rotated , the intensity at different scattering angles is recorded .
Thus , with the parallel beam optics , large sample areas can be irradiated .
Scattering angles very close to the direct beam can be investigated , and some ...
As the analyzer is rotated , the intensity at different scattering angles is recorded .
Thus , with the parallel beam optics , large sample areas can be irradiated .
Scattering angles very close to the direct beam can be investigated , and some ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |