Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
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Page 134
... sin ( 2 vt – 01 ) A 2TV ( 4-5 ) E2 A sin ( 2πνι – φο ) . ( 4-6 ) These waves are of the same frequency v and therefore of the same wavelength i , but differ in amplitude A and in phase 0. The dotted curve shows their sum E3 , which is ...
... sin ( 2 vt – 01 ) A 2TV ( 4-5 ) E2 A sin ( 2πνι – φο ) . ( 4-6 ) These waves are of the same frequency v and therefore of the same wavelength i , but differ in amplitude A and in phase 0. The dotted curve shows their sum E3 , which is ...
Page 149
... forward or backward directions . cos \ cos o ( sin 2 ) - = R 20B R sin 208 Figure 4-17 Intersection of cones of diffracted rays with Hull / Debye - Scherrer film . 50 40 30 T sina o cos e LORENTZ - 4-9 149 Lorentz Factor.
... forward or backward directions . cos \ cos o ( sin 2 ) - = R 20B R sin 208 Figure 4-17 Intersection of cones of diffracted rays with Hull / Debye - Scherrer film . 50 40 30 T sina o cos e LORENTZ - 4-9 149 Lorentz Factor.
Contents
Geometry of Crystals | 31 |
Geometry | 89 |
Intensities Diffraction | 123 |
Copyright | |
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absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction function given grain hexagonal incident beam increases indices intensity kind lattice Laue material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray