Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. KEY TOPICS: The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts--Fundamentals; experimental methods; and applications. MARKET: Designed for beginners, not as a reference tool for the advanced reader. |
From inside the book
Results 1-3 of 84
Page 151
The net result is that the diffracted beam is of lower intensity than one would
expect for a specimen of no absorption . A calculation of this effect shows that the
relative absorption increases as 6 decreases , for any given cylindrical specimen
.
The net result is that the diffracted beam is of lower intensity than one would
expect for a specimen of no absorption . A calculation of this effect shows that the
relative absorption increases as 6 decreases , for any given cylindrical specimen
.
Page 254
specimen film Figure 7-15 Transmission pinhole method for thick specimens : ( a
) section through incident beam : ( b ) ... 14-9 , the specimen thickness which
produces the maximum diffracted intensity is given by 1 / u , where u is the linear
...
specimen film Figure 7-15 Transmission pinhole method for thick specimens : ( a
) section through incident beam : ( b ) ... 14-9 , the specimen thickness which
produces the maximum diffracted intensity is given by 1 / u , where u is the linear
...
Page 417
When the specimen is rotated about the axis AA ' , the axis BB ' normal to the
specimen surface rotates in a vertical plane , but CN , the diffraction plane normal
remains fixed in a horizontal position normal to AA ' . The rotation angles X and o
...
When the specimen is rotated about the axis AA ' , the axis BB ' normal to the
specimen surface rotates in a vertical plane , but CN , the diffraction plane normal
remains fixed in a horizontal position normal to AA ' . The rotation angles X and o
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material means measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Authors | Bernard Dennis Cullity, Stuart R. Stock, Stuart R.. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |