Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
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Page 151
The net result is that the diffracted beam is of lower intensity than one would
expect for a specimen of no absorption. A calculation of this effect shows that the
relative absorption increases as 9 decreases, for any given cylindrical specimen.
The net result is that the diffracted beam is of lower intensity than one would
expect for a specimen of no absorption. A calculation of this effect shows that the
relative absorption increases as 9 decreases, for any given cylindrical specimen.
Page 254
Figure 7-15 Transmission pinhole method specimen film for thick specimens: (a)
section through incident beam; (b) partial pattern obtained. (a) (b) tion). As will be
shown in Sec. 14-9, the specimen thickness which produces the maximum ...
Figure 7-15 Transmission pinhole method specimen film for thick specimens: (a)
section through incident beam; (b) partial pattern obtained. (a) (b) tion). As will be
shown in Sec. 14-9, the specimen thickness which produces the maximum ...
Page 417
When the specimen is rotated about the axis AA , the axis BB normal to the
specimen surface rotates in a vertical plane, but CN, the diffraction plane normal
remains fixed in a horizontal position normal to AA'. The rotation angles X and d
are ...
When the specimen is rotated about the axis AA , the axis BB normal to the
specimen surface rotates in a vertical plane, but CN, the diffraction plane normal
remains fixed in a horizontal position normal to AA'. The rotation angles X and d
are ...
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |