Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
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Page 436
While it has had some application to stress measurement in ceramics and rocks,
its major use is the measurement of residual stress in metals and alloys, X-ray
diffraction, for example, has been used to measure stresses around a fatigue
crack ...
While it has had some application to stress measurement in ceramics and rocks,
its major use is the measurement of residual stress in metals and alloys, X-ray
diffraction, for example, has been used to measure stresses around a fatigue
crack ...
Page 438
i Figure 15-2 Residual stress induced by plastic flow in bending: (a) loaded
below elastic limit; (b) loaded beyond elastic limit; (c) unloaded. Shaded regions
have been plastically strained. A' in its lower outside portion. It is quite common to
find ...
i Figure 15-2 Residual stress induced by plastic flow in bending: (a) loaded
below elastic limit; (b) loaded beyond elastic limit; (c) unloaded. Shaded regions
have been plastically strained. A' in its lower outside portion. It is quite common to
find ...
Page 439
This method is inherently destructive, even for the measurement of surface stress,
and slow. Part of the residuallystressed object is removed, by cutting or some
other method. This removal upsets the pre-existing balance of forces, with the ...
This method is inherently destructive, even for the measurement of surface stress,
and slow. Part of the residuallystressed object is removed, by cutting or some
other method. This removal upsets the pre-existing balance of forces, with the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |