Elements of X-ray Diffraction1 Properties of X-rays 2 Geometry of Crystals 3 Diffraction I: Directions of Diffracted Beams 4 Diffraction II: Intensities of Diffracted Beams 5 Diffraction III: Non-Ideal Samples 6 Laure Photographs 7 Powder Photographs 8 Diffractometer and Spectrometer 9 Orientation and Quality of Single Crystals 10 Structure of Polycrystalline Aggregates 11 Determination of Crystal Structure 12 Precise Parameter Measurements 13 Phase-Diagram Determination 14 Order-Disorder Transformation 15 Chemical Analysis of X-ray Diffraction 16 Chemical Analysis by X-ray Spectrometry 17 Measurements of Residual Stress 18 Polymers 19 Small Angle Scatters 20 Transmission Electron Microscope |
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Results 1-3 of 79
Page 251
Klug and Alexander [G.17), for example, call it the “monochromatic-pinhole
technique.”) Either a transmission or a backreflection camera may be used. A
typical transmission photograph recorded on Standard x-ray film is shown in Fig.
7-11 for ...
Klug and Alexander [G.17), for example, call it the “monochromatic-pinhole
technique.”) Either a transmission or a backreflection camera may be used. A
typical transmission photograph recorded on Standard x-ray film is shown in Fig.
7-11 for ...
Page 264
Transmission Camera Figure 8-1 shows a transmission camera, in this case a
dual-purpose instrument, and Fig. 8-2 illustrates its essential parts. A is the
collimator, a device used to produce a narrow incident beam made up of rays as
nearly ...
Transmission Camera Figure 8-1 shows a transmission camera, in this case a
dual-purpose instrument, and Fig. 8-2 illustrates its essential parts. A is the
collimator, a device used to produce a narrow incident beam made up of rays as
nearly ...
Page 663
... pole method of finding, 76, 79 Transmission, 519 Transmission camera, 264–
265 Transmission double crystal topographs, 526 Transmission electron
microscopy (TEM), 118, 331, 514, 571–591 ray diagram, 119 Transmission Laue
camera, ...
... pole method of finding, 76, 79 Transmission, 519 Transmission camera, 264–
265 Transmission double crystal topographs, 526 Transmission electron
microscopy (TEM), 118, 331, 514, 571–591 ray diagram, 119 Transmission Laue
camera, ...
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Common terms and phrases
alloy AuCu austenite axes axis back-reflection Bragg angle Bragg's law Bravais lattice calculated camera composition constant copper crystallite cubic curve decreases density detector determined diffracted beam diffracted intensity diffraction lines diffraction pattern diffractometer direction effect electrons energy equation error Ewald sphere example extrapolation face-centered face-centered cubic factor film fraction given grain hexagonal Hull/Debye–Scherrer incident beam indices integrated intensity lattice parameter lattice points Laue pattern Laue spots layer martensite measured metal normal observed obtained orthorhombic parallel peak percent phase photographic pinhole plane plot pole figure position powder pattern preferred orientation produce projection pulses radiation rays reciprocal lattice reciprocal space reflection relative rotation sample scattering shown in Fig shows slit solid solution space specimen stress substance superlattice surface symmetry temperature tetragonal texture tion transmission unit cell vector voltage wave wavelength x-ray diffraction x-ray tube
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials Pearson education |
| Authors | Bernard Dennis Cullity, Stuart R. Stock |
| Edition | 3, illustrated |
| Publisher | Prentice Hall, 2001 |
| Original from | the University of Michigan |
| Digitized | 18 Feb 2010 |
| ISBN | 0201610914, 9780201610918 |
| Length | 664 pages |
| Subjects | › Technology & Engineering / Mechanical |
| Export Citation | BiBTeX EndNote RefMan |