## Elements of X-ray Diffraction Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. |

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Page 128

The following question then arises : is the

sum of the

an atom of atomic number Z , i.e. , an atom containing Z electrons , scatter a

...

The following question then arises : is the

**wave**scattered by an atom simply thesum of the

**waves**scattered by its component electrons ? More precisely , doesan atom of atomic number Z , i.e. , an atom containing Z electrons , scatter a

**wave**...

Page 135

To find an analytical expression for a vector representing a

vector in the complex plane as in Fig . 4-12 . Here again the amplitude and phase

of the

To find an analytical expression for a vector representing a

**wave**, draw the**wave**vector in the complex plane as in Fig . 4-12 . Here again the amplitude and phase

of the

**wave**are given by A , the length of the vector , and d , the angle between ...Page 136

Adding the scattered

addition of the complex numbers representing the amplitude and phase of each

Adding the scattered

**waves**from each of the atoms in the unit cell requiresaddition of the complex numbers representing the amplitude and phase of each

**wave**. The amplitude of each**wave**is given by the appropriate value of f for the ...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption alloy angle appear applied atoms axis calculated called camera cause circle complete consider constant contains counting crystal cubic curve depends described detector determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons energy equal equation error example factor Figure film fraction given grain hexagonal incident beam increases indices intensity kind lattice Laue LIBRARIES material measured metal method MICHIGAN normal Note observed obtained occur orientation origin parallel parameter particular pattern peak percent phase plane plot pole position possible powder produce projection radiation rays reciprocal lattice recorded reference reflection region relation relative result rotation sample scattering shown shown in Fig shows simple single solid space specimen sphere stress structure surface temperature tion transmission tube unit cell usually vector wave wavelength x-ray