Atomic Force Microscopy/Scanning Tunneling MicroscopyM.T. Bray, Samuel H. Cohen, Marcia L. Lightbody The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces. |
Contents
2 | |
Scanning Probe Microscopy Imaging and Characterization of Biological | 19 |
Resolution and Limitations in Biological Applications of Atomic Force | 43 |
I Tubulin | 52 |
ScaleArea Analysis of Scanning Tunneling MicroscopyAtomic Force | 67 |
Imaging Matrix Materials and Fundamental Lamellae Structure | 77 |
Atomic Force Microscopy Images of Starch Polymer Crystalline | 85 |
Scanning Tunneling Microscopy Studies on Xanthan Gum | 91 |
Morphological Features of Polyethylene and Polyimides by Atomic Force | 237 |
Studies of High Performance Fibers by Atomic Force Microscopy | 251 |
Atomic Force and Electron Microscopic Investigations of Lead Selenide Crystals | 265 |
Comparative Study of the Surface Roughness | 281 |
Applications of a Combined Scanning Tunneling Microscope | 303 |
Molecular Imaging and Surface Forces | 311 |
Linearity and Calibration of Scanning Probe | 321 |
Sample Holders for Imaging Intact Particles | 327 |
Atomic Force Microscopic Imaging of Biomineral Powder Samples Formed | 101 |
Scanning Tunneling Microscopy Studies of Fullerene C60 | 109 |
Scanning Tunneling Microscopy Studies of AlcoholAlkane Mixtures Adsorbed | 117 |
Fracture Surface Topography of TNT Using Atomic Force Microscopy | 127 |
Scanning Tunneling Microscopy and Spectroscopy of Carbon Nanotubes | 137 |
Examination of Plain Carbon Steels Using an Atomic Force Microscope | 167 |
Scanning Tunneling Microscopy of Porous SiliconBased Surfaces | 181 |
Atomic Force Microscope Study of Ferroelastic Domains | 189 |
Atomic Scale Imaging of Minerals with the Atomic Force Microscope | 195 |
Scanning Tunneling Microscopy of the Structural and Electronic Properties | 203 |
Combined Scanning Tunneling Microscope and Quartz Microbalance Study | 211 |
Scanning Tunneling Microscopy and Atomic Force Microscopy Studies | 229 |
Scanning Tunneling Microscopy of Freeze Fracture | 339 |
The Scanning Probe Microscope as a Metrology Tool | 347 |
Use of Atomic Force Microscopy in the Determination of Image Contrast | 359 |
Photon Tunneling Microscopy of Polymers | 369 |
Morphology and Molecular Ordering of LangmuirBlodgett | 381 |
PTIR NanotipsA Mechanical Technique for Sharpening | 393 |
Atomic Force Microscopy Study of Electron | 401 |
Measuring the Mechanical Properties of Preformed NanometerSize Gold | 411 |
Analysis and Interpretation of Scanning Tunneling Microscopy Images | 423 |
A ClosedLoop Optical Scan Correction System | 436 |
Vibrating Probe AC Methods in Atomic Force Microscopy | 447 |
Other editions - View all
Atomic Force Microscopy/Scanning Tunneling Microscopy Samuel H. Cohen,M.T. Bray,Marcia L. Lightbody Limited preview - 1994 |
Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Samuel H. Cohen,Marcia L. Lightbody No preview available - 2013 |
Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Samuel H. Cohen,Marcia L. Lightbody No preview available - 2014 |
Common terms and phrases
adsorbed adsorption AFM image annealed applied atomic force microscopy Atomic Force Microscopy/Scanning bilayers cantilever carbon carbon nanotubes cell characterization clusters coating crystalline crystallites deposited diameter Edited by S.H. electron microscopy etched ferroelastic fiber Force Microscopy/Scanning Tunneling fracture frequency fullerene graphite Hansma height high resolution HOPG interaction lamellae layer Lett lipid luciferase magnification materials measurements membrane metal method mica Microscopy/Scanning Tunneling Microscopy microtubules mode molecular molecules monolayer morphology nanoclusters nanometer Nanoscope nanotubes observed obtained optical orientation otoliths particles PbSe Phys piezoelectric Plenum Press polymer porous silicon protein region roughness S.H. Cohen sample surface scale scanner scanning force microscope scanning probe microscope scanning tunneling microscopy shown in Figure shows single crystals SiO2 solution spectroscopy STM image substrate surface topography techniques Technol temperature thickness thin films tubulin tunneling current Tunneling Microscopy Edited voltage xanthan µm²